Inventor · disambiguated record
Joseph G. Pawletko
Also filed as: PAWLETKO JOSEPH G
11 granted patents·568 citations·filing 1993–2001
93Inventor score
Technology areasG11C
Files withADVANCED MICRO DEVICES INC11
Top patents by PatentIndex Score
11 records- 0195US5335198AFlash EEPROM array with high enduranceADVANCED MICRO DEVICES INC·Filed 1993·Granted Aug 2, 1994·197 cites·18 claims
- 0291US6181605B1Global erase/program verification apparatus and methodADVANCED MICRO DEVICES INC·Filed 1999·Granted Jan 30, 2001·94 cites·4 claims
- 0390US6327183B1Nonlinear stepped programming voltageADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 4, 2001·65 cites·15 claims
- 0490US6304487B1Register driven means to control programming voltagesADVANCED MICRO DEVICES INC·Filed 2000·Granted Oct 16, 2001·60 cites·28 claims
- 0586US6246610B1Symmetrical program and erase scheme to improve erase time degradation in NAND devicesADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 12, 2001·42 cites·13 claims
- 0683US6295228B1System for programming memory cellsADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 25, 2001·35 cites·11 claims
- 0780US6246611B1System for erasing a memory cellADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 12, 2001·29 cites·14 claims
- 0868US6525966B1Method and apparatus for adjusting on-chip current reference for EEPROM sensingADVANCED MICRO DEVICES INC·Filed 2001·Granted Feb 25, 2003·16 cites·27 claims
- 0954US6141244AMulti level sensing of NAND memory cells by external bias currentADVANCED MICRO DEVICES INC·Filed 1999·Granted Oct 31, 2000·14 cites·12 claims
- 1052US6545912B1Erase verify mode to evaluate negative Vt'sADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 8, 2003·7 cites·14 claims
- 1146US6185130B1Programmable current sourceADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 6, 2001·9 cites·31 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →