Inventor · disambiguated record
John J. Pickerd
Also filed as: PICKERD JOHN J
63 granted patents·39 pending applications·623 citations·filing 1997–2025
98Inventor score
Top patents by PatentIndex Score
102 records- 0195US12442852B2Tuning a device under test using parallel pipeline machine learning assistanceTEKTRONIX INC·Filed 2023·Granted Oct 14, 2025·2 cites·15 claims
- 0294US12146914B2Bit error ratio estimation using machine learningTEKTRONIX INC·Filed 2022·Granted Nov 19, 2024·4 cites·19 claims
- 0393US5978742AMethod and apparatus for digital sampling of electrical waveformsTEKTRONIX INC·Filed 1997·Granted Nov 2, 1999·113 cites·21 claims
- 0492US7474972B2Bandwidth multiplication for a test and measurement instrument using non-periodic functions for mixingTEKTRONIX INC·Filed 2007·Granted Jan 6, 2009·24 cites·24 claims
- 0592US6615148B2Streaming distributed test and measurement instrumentTEKTRONIX INC·Filed 2001·Granted Sep 2, 2003·57 cites·16 claims
- 0691US7460983B2Signal analysis system and calibration methodTEKTRONIX INC·Filed 2006·Granted Dec 2, 2008·30 cites·21 claims
- 0791US7414411B2Signal analysis system and calibration method for multiple signal probesTEKTRONIX INC·Filed 2006·Granted Aug 19, 2008·22 cites·16 claims
- 0891US7408363B2Signal analysis system and calibration method for processing acquires signal samples with an arbitrary loadTEKTRONIX INC·Filed 2006·Granted Aug 5, 2008·22 cites·18 claims
- 0990US8588703B2Arbitrary multiband overlay mixer apparatus and method for bandwidth multiplicationTEKTRONIX INC·Filed 2013·Granted Nov 19, 2013·7 cites·10 claims
- 1089US6892150B2Combined analog and DSP trigger system for a digital storage oscilloscopeTEKTRONIX INC·Filed 2002·Granted May 10, 2005·43 cites·13 claims
- 1186US7405575B2Signal analysis system and calibration method for measuring the impedance of a device under testTEKTRONIX INC·Filed 2006·Granted Jul 29, 2008·18 cites·23 claims
- 1286US6681191B1Frequency domain analysis system for a time domain measurement instrumentTEKTRONIX INC·Filed 2000·Granted Jan 20, 2004·35 cites·5 claims
- 1385US6807496B2Acquisition system for a long record length digital storage oscilloscopeTEKTRONIX INC·Filed 2002·Granted Oct 19, 2004·32 cites·31 claims
- 1484US7298206B2Multi-band amplifier for test and measurement instrumentsTEKTRONIX INC·Filed 2006·Granted Nov 20, 2007·15 cites·20 claims
- 1583US6748335B2Acquisition system for a multi-channel relatively long record length digital storage oscilloscopeTEKTRONIX INC·Filed 2002·Granted Jun 8, 2004·30 cites·31 claims
- 1682US9772391B2Method for probe equalizationTEKTRONIX INC·Filed 2014·Granted Sep 26, 2017·4 cites·15 claims
- 1782US7271575B2Oscilloscope based return loss analyzerTEKTRONIX INC·Filed 2003·Granted Sep 18, 2007·31 cites·19 claims
- 1882US7206722B2Oscilloscope having an enhancement filterTEKTRONIX INC·Filed 2005·Granted Apr 17, 2007·11 cites·9 claims
- 1981US10345339B2Group delay based averagingTEKTRONIX INC·Filed 2016·Granted Jul 9, 2019·2 cites·20 claims
- 2081US8650010B2Apparatus and method for generating a test signal with emulated crosstalkM PARTHASARATHY RAJU·Filed 2010·Granted Feb 11, 2014·19 cites·16 claims
- 2179US10097222B2Variable passive network noise filter for noise reductionTEKTRONIX INC·Filed 2017·Granted Oct 9, 2018·3 cites·20 claims
- 2279US9140723B2Signal acquisition probe storing compressed or compressed and filtered time domain impulse or step response data for use in a signal measurement systemBOOMAN RICHARD A·Filed 2010·Granted Sep 22, 2015·4 cites·6 claims
- 2378US11923895B2Optical transmitter tuning using machine learning and reference parametersTEKTRONIX INC·Filed 2022·Granted Mar 5, 2024·1 cites·20 claims
- 2478US7257497B2Sequential frequency band acquisition apparatus for test and measurement instrumentsTEKTRONIX INC·Filed 2006·Granted Aug 14, 2007·9 cites·11 claims
- 2577US11923896B2Optical transceiver tuning using machine learningTEKTRONIX INC·Filed 2022·Granted Mar 5, 2024·1 cites·12 claims
- 2676US11146280B2Digital signal processing waveform synthesis for fixed sample rate signal sourcesTEKTRONIX INC·Filed 2019·Granted Oct 12, 2021·2 cites·20 claims
- 2776US8928514B1Harmonic time domain interleave to extend oscilloscope bandwidth and sample rateTEKTRONIX INC·Filed 2014·Granted Jan 6, 2015·3 cites·18 claims
- 2874US6525522B1System for determining the phase and magnitude of an incident signal relative to a cyclical reference signalTEKTRONIX INC·Filed 2001·Granted Feb 25, 2003·18 cites·68 claims
- 2973US2025370039A1Ai embedding vector data base calibration architectureTEKTRONIX INC·Filed 2025·Application pending·0 cites
- 3072US12092692B2Cyclic loop image representation for waveform dataTEKTRONIX INC·Filed 2021·Granted Sep 17, 2024·0 cites·10 claims
- 3172US9432042B2Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixingTEKTRONIX INC·Filed 2014·Granted Aug 30, 2016·4 cites·13 claims
- 3271US10330700B2Signal acquisition probe storing compressed or compressed and filtered time domain impulse or step response data for use in a signal measurement systemTEKTRONIX INC·Filed 2015·Granted Jun 25, 2019·1 cites·4 claims
- 3371US6459256B1Digital storage oscilloscopeTEKTRONIX INC·Filed 2000·Granted Oct 1, 2002·16 cites·6 claims
- 3469US10502763B2Noise reduction in digitizing systemsTEKTRONIX INC·Filed 2016·Granted Dec 10, 2019·1 cites·20 claims
- 3567US10432434B2Multi-band noise reduction systems and methodsTEKTRONIX INC·Filed 2017·Granted Oct 1, 2019·2 cites·20 claims
- 3666US12505532B2Method and apparatus for automated defect detectionSONIX INC·Filed 2022·Granted Dec 23, 2025·0 cites·24 claims
- 3766US9407280B1Harmonic time domain interleave to extend arbitrary waveform generator bandwidth and sample rateTEKTRONIX INC·Filed 2015·Granted Aug 2, 2016·2 cites·16 claims
- 3865US12379414B2System and method for multi-level signal cyclic loop image representations for measurements and machine learningTEKTRONIX INC·Filed 2021·Granted Aug 5, 2025·0 cites·20 claims
- 3965US6915218B2Method of constraints control for oscilloscope timebase subsection and display parametersTEKTRONIX INC·Filed 2003·Granted Jul 5, 2005·11 cites·13 claims
- 4065US2024214068A1Optical transceiver tuning using machine learningTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 4164US2024168471A1Interoperability predictor using machine learning and repository of tx, channel, and rx models from multiple vendorsTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 4264US2025102573A1System and method for decimated sweep measurements of a device under test using machine learningTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 4363US12265125B2System and method for separation and classification of signals using cyclic loop imagesTEKTRONIX INC·Filed 2021·Granted Apr 1, 2025·0 cites·21 claims
- 4463US2024169210A1Methods for 3d tensor builder for input to machine learningTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 4563US2025130259A1Power probe fixtures and adaptersTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 4662US11940889B2Combined TDECQ measurement and transmitter tuning using machine learningTEKTRONIX INC·Filed 2022·Granted Mar 26, 2024·0 cites·20 claims
- 4762US11907090B2Machine learning for taps to accelerate TDECQ and other measurementsTEKTRONIX INC·Filed 2022·Granted Feb 20, 2024·0 cites·20 claims
- 4862US8233569B2Realtime spectrum trigger system on realtime oscilloscopeTAN KAN·Filed 2006·Granted Jul 31, 2012·4 cites·16 claims
- 4962US6917889B2Method and apparatus for visually time-correlating waveform measurements to a source waveformTEKTRONIX INC·Filed 2003·Granted Jul 12, 2005·10 cites·13 claims
- 5062US2025130279A1Power vector analyzerTEKTRONIX INC·Filed 2024·Application pending·0 cites
Showing the top 50 of 102 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →