Inventor · disambiguated record
John B. Putman
Also filed as: PUTMAN JOHN B
94 granted patents·11 pending applications·314 citations·filing 1989–2025
99Inventor score
Files withNANOTRONICS IMAGING INC87NANOTRONICS HEALTH LLC6PUTMAN MATTHEW C6TECH PRO INC3PUTMAN JOHN B2
Top patents by PatentIndex Score
105 records- 0197US12153411B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2023·Granted Nov 26, 2024·2 cites·20 claims
- 0297US11156992B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2019·Granted Oct 26, 2021·15 cites·13 claims
- 0397US11086988B1Method, systems and apparatus for intelligently emulating factory control systems and simulating response dataNANOTRONICS IMAGING INC·Filed 2020·Granted Aug 10, 2021·8 cites·20 claims
- 0497US10169852B1Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imagingNANOTRONICS IMAGING INC·Filed 2018·Granted Jan 1, 2019·29 cites·18 claims
- 0597US10146041B1Systems, devices and methods for automatic microscope focusNANOTRONICS IMAGING INC·Filed 2018·Granted Dec 4, 2018·23 cites·20 claims
- 0697US10048477B1Camera and specimen alignment to facilitate large area imaging in microscopyNANOTRONICS IMAGING INC·Filed 2017·Granted Aug 14, 2018·30 cites·17 claims
- 0796US11156991B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2019·Granted Oct 26, 2021·12 cites·20 claims
- 0896US10970831B2Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imagingNANOTRONICS IMAGING INC·Filed 2020·Granted Apr 6, 2021·4 cites·20 claims
- 0996US10247910B1Systems, devices and methods for automatic microscopic focusNANOTRONICS IMAGING INC·Filed 2018·Granted Apr 2, 2019·18 cites·32 claims
- 1094US11815673B2Method and system for mapping objects on unknown specimensNANOTRONICS IMAGING INC·Filed 2022·Granted Nov 14, 2023·2 cites·17 claims
- 1194US11672933B1Method and system for bi-level treatment of sleep apneaNANOTRONICS HEALTH LLC·Filed 2022·Granted Jun 13, 2023·3 cites·15 claims
- 1294US11662563B2Fluorescence microscopy inspection systems, apparatus and methods with darkfield channelNANOTRONICS IMAGING INC·Filed 2022·Granted May 30, 2023·2 cites·20 claims
- 1394US11117328B2Systems, methods, and media for manufacturing processesNANOTRONICS IMAGING INC·Filed 2020·Granted Sep 14, 2021·15 cites·20 claims
- 1494US10545096B1Marco inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2019·Granted Jan 28, 2020·7 cites·6 claims
- 1593US11411293B1Fault protected signal splitter apparatusNANOTRONICS IMAGING INC·Filed 2021·Granted Aug 9, 2022·2 cites·24 claims
- 1692US10481379B1Method and system for automatically mapping fluid objects on a substrateNANOTRONICS IMAGING INC·Filed 2018·Granted Nov 19, 2019·9 cites·19 claims
- 1791US11727672B1System and method for generating training data sets for specimen defect detectionNANOTRONICS IMAGING INC·Filed 2022·Granted Aug 15, 2023·2 cites·17 claims
- 1891US11063965B1Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2020·Granted Jul 13, 2021·3 cites·19 claims
- 1991US10578850B1Fluorescence microscopy inspection systems, apparatus and methodsNANOTRONICS IMAGING INC·Filed 2019·Granted Mar 3, 2020·9 cites·19 claims
- 2090US12449792B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2024·Granted Oct 21, 2025·0 cites·20 claims
- 2190US12298489B2Fluorescence microscopy inspection systems, apparatus and methods with darkfield channelNANOTRONICS IMAGING INC·Filed 2023·Granted May 13, 2025·1 cites·20 claims
- 2290US12111923B2Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2023·Granted Oct 8, 2024·1 cites·20 claims
- 2390US11656429B2Systems, devices, and methods for automatic microscopic focusNANOTRONICS IMAGING INC·Filed 2022·Granted May 23, 2023·1 cites·20 claims
- 2490US11561383B2Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating theretoNANOTRONICS IMAGING INC·Filed 2021·Granted Jan 24, 2023·2 cites·20 claims
- 2589US10467740B1Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imagingNANOTRONICS IMAGING INC·Filed 2018·Granted Nov 5, 2019·4 cites·20 claims
- 2688US12153412B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2023·Granted Nov 26, 2024·0 cites·20 claims
- 2788US11100221B2Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2020·Granted Aug 24, 2021·2 cites·16 claims
- 2886US11294162B2Fluorescence microscopy inspection systems, apparatus and methods with darkfield channelNANOTRONICS IMAGING INC·Filed 2020·Granted Apr 5, 2022·2 cites·20 claims
- 2986US10254214B1Systems, devices, and methods for combined wafer and photomask inspectionNANOTRONICS IMAGING INC·Filed 2018·Granted Apr 9, 2019·6 cites·12 claims
- 3085US11953863B2Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2023·Granted Apr 9, 2024·0 cites·17 claims
- 3185US10915992B1System, method and apparatus for macroscopic inspection of reflective specimensNANOTRONICS IMAGING INC·Filed 2019·Granted Feb 9, 2021·3 cites·20 claims
- 3285US6795172B2Method for preparing a cut surface in uncured rubber samples for measuring filter dispersionTECH PRO INC·Filed 2001·Granted Sep 21, 2004·35 cites·8 claims
- 3384US11947671B2Method, systems and apparatus for intelligently emulating factory control systems and simulating response dataNANOTRONICS IMAGING INC·Filed 2023·Granted Apr 2, 2024·0 cites·20 claims
- 3484US11693956B2Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2021·Granted Jul 4, 2023·1 cites·20 claims
- 3583US12118089B2Method, systems and apparatus for intelligently emulating factory control systems and simulating response dataNANOTRONICS IMAGING INC·Filed 2024·Granted Oct 15, 2024·0 cites·20 claims
- 3683US11948270B2Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imagingNANOTRONICS IMAGING INC·Filed 2023·Granted Apr 2, 2024·0 cites·20 claims
- 3783US2025028819A1Method, systems and apparatus for intelligently emulating factory control systems and simulating response dataNANOTRONICS IMAGING INC·Filed 2024·Application pending·0 cites
- 3883US2025315017A1Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2025·Application pending·0 cites
- 3982US12174361B2Method and system for mapping objects on unknown specimensNANOTRONICS IMAGING INC·Filed 2023·Granted Dec 24, 2024·0 cites·20 claims
- 4082US10509199B2Systems, devices and methods for automatic microscopic focusNANOTRONICS IMAGING INC·Filed 2019·Granted Dec 17, 2019·2 cites·32 claims
- 4182US9488819B2Automatic microscopic focus system and method for analysis of transparent or low contrast specimensPUTMAN MATTHEW C·Filed 2012·Granted Nov 8, 2016·9 cites·14 claims
- 4280US11669058B1Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2022·Granted Jun 6, 2023·0 cites·14 claims
- 4379US12339631B2Dynamic monitoring and securing of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2024·Granted Jun 24, 2025·0 cites·20 claims
- 4479US12111922B2Method, systems and apparatus for intelligently emulating factory control systems and simulating response dataNANOTRONICS IMAGING INC·Filed 2023·Granted Oct 8, 2024·0 cites·13 claims
- 4579US11955686B2Fault protected signal splitter apparatusNANOTRONICS IMAGING INC·Filed 2023·Granted Apr 9, 2024·0 cites·20 claims
- 4678US12153387B2Threshold determination for predictive process control of factory processes, equipment and automated systemsNANOTRONICS IMAGING INC·Filed 2023·Granted Nov 26, 2024·0 cites·15 claims
- 4778US11846765B2Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating theretoNANOTRONICS IMAGING INC·Filed 2023·Granted Dec 19, 2023·0 cites·20 claims
- 4878US11796785B2Systems, devices and methods for automatic microscope focusNANOTRONICS IMAGING INC·Filed 2022·Granted Oct 24, 2023·0 cites·11 claims
- 4978US11709483B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2021·Granted Jul 25, 2023·0 cites·20 claims
- 5078US11669078B2Predictive process control for a manufacturing processNANOTRONICS IMAGING INC·Filed 2021·Granted Jun 6, 2023·0 cites·20 claims
Showing the top 50 of 105 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →