Inventor · disambiguated record
Jochen Rinderknecht
Also filed as: RINDERKNECHT JOCHEN
2 granted patents·16 citations·filing 2007–2011
51Inventor score
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2 records- 0184US7421060B2Method of determining an orientation of a crystal lattice of a first substrate relative to a crystal lattice of a second substrateADVANCED MICRO DEVICES INC·Filed 2007·Granted Sep 2, 2008·16 cites·21 claims
- 0226US8761489B2Method and apparatus for characterizing discontinuities in semiconductor devicesRINDERKNECHT JOCHEN·Filed 2011·Granted Jun 24, 2014·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →