Inventor · disambiguated record
Joseph Scola
Also filed as: SCOLA JOSEPH · SCOLA JOSEPH R
9 granted patents·824 citations·filing 1996–2007
92Inventor score
Top patents by PatentIndex Score
9 records- 0198US6175644B1Machine vision system for object feature analysis and validation based on multiple object imagesCOGNEX CORP·Filed 1998·Granted Jan 16, 2001·287 cites·9 claims
- 0295US5949901ASemiconductor device image inspection utilizing image subtraction and threshold imagingFiled 1996·Granted Sep 7, 1999·207 cites·14 claims
- 0385US7944205B2System for measuring a magnetic resonance signal based on a hybrid superconductive-magnetoresistive sensorCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2007·Granted May 17, 2011·14 cites·27 claims
- 0484US5742037AMethod and apparatus for high speed identification of objects having an identifying featureCOGNEX CORP·Filed 1996·Granted Apr 21, 1998·91 cites·15 claims
- 0576US6714679B1Boundary analyzerCOGNEX CORP·Filed 1999·Granted Mar 30, 2004·103 cites·45 claims
- 0676US5949905AModel-based adaptive segmentationFiled 1996·Granted Sep 7, 1999·64 cites·10 claims
- 0774US6920241B1System and method for bundled location and regional inspectionCOGNEX CORP·Filed 2000·Granted Jul 19, 2005·26 cites·20 claims
- 0874US6587582B1Semiconductor device image inspection with contrast enhancementCOGNEX CORP·Filed 2001·Granted Jul 1, 2003·10 cites·15 claims
- 0963US6298149B1Semiconductor device image inspection with contrast enhancementCOGNEX CORP·Filed 1998·Granted Oct 2, 2001·22 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →