Inventor · disambiguated record
John J. Shushereba
Also filed as: SHUSHEREBA JOHN · SHUSHEREBA JOHN J · SHUSHEREBA JOHN JAMES
4 granted patents·270 citations·filing 1985–1997
82Inventor score
Files withIBM4
Top patents by PatentIndex Score
4 records- 0192US5983380AWeighted random pattern built-in self-testIBM·Filed 1997·Granted Nov 9, 1999·131 cites·20 claims
- 0289US5982189ABuilt-in dynamic stress for integrated circuitsIBM·Filed 1997·Granted Nov 9, 1999·89 cites·19 claims
- 0377US5930270ALogic built in self-test diagnostic methodIBM·Filed 1997·Granted Jul 27, 1999·41 cites·26 claims
- 0438US4696005AApparatus for reducing test data storage requirements for high speed VLSI circuit testingIBM·Filed 1985·Granted Sep 22, 1987·9 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →