Inventor · disambiguated record
John Smythe
Also filed as: SMYTHE III JOHN A · SMYTHE JOHN · SMYTHE JOHN A
139 granted patents·16 pending applications·1,629 citations·filing 1997–2024
99Inventor score
Top patents by PatentIndex Score
155 records- 0199US9865456B1Methods of forming silicon nitride by atomic layer deposition and methods of forming semiconductor structuresMICRON TECHNOLOGY INC·Filed 2016·Granted Jan 9, 2018·401 cites·26 claims
- 0299US8048755B2Resistive memory and methods of processing resistive memoryMICRON TECHNOLOGY INC·Filed 2010·Granted Nov 1, 2011·55 cites·29 claims
- 0398US11227864B1Storage node after three-node access device formation for vertical three dimensional (3D) memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 18, 2022·12 cites·26 claims
- 0498US8223539B2GCIB-treated resistive deviceSMYTHE JOHN·Filed 2010·Granted Jul 17, 2012·66 cites·38 claims
- 0598US7521378B2Low temperature process for polysilazane oxidation/densificationMICRON TECHNOLOGY INC·Filed 2004·Granted Apr 21, 2009·173 cites·84 claims
- 0697US9985049B1Arrays of elevationally-extending strings of memory cells and methods of forming memory arraysMICRON TECHNOLOGY INC·Filed 2017·Granted May 29, 2018·21 cites·28 claims
- 0796US11417565B2Methods of forming high aspect ratio openings and methods of forming high aspect ratio featuresMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 16, 2022·3 cites·20 claims
- 0896US11289491B1Epitaxtal single crystalline silicon growth for a horizontal access deviceMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 29, 2022·5 cites·29 claims
- 0996US11239117B1Replacement gate dielectric in three-node access device formation for vertical three dimensional (3D) memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 1, 2022·4 cites·20 claims
- 1096US8114468B2Methods of forming a non-volatile resistive oxide memory arraySANDHU GURTEJ·Filed 2008·Granted Feb 14, 2012·36 cites·35 claims
- 1196US7737039B2Spacer process for on pitch contacts and related structuresMICRON TECHNOLOGY INC·Filed 2007·Granted Jun 15, 2010·25 cites·14 claims
- 1296US7514366B2Methods for forming shallow trench isolationMICRON TECHNOLOGY INC·Filed 2006·Granted Apr 7, 2009·42 cites·42 claims
- 1395US11769795B2Channel conduction in semiconductor devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 26, 2023·2 cites·19 claims
- 1495US8241944B2Resistive RAM devices and methodsGREELEY JOSEPH N·Filed 2010·Granted Aug 14, 2012·18 cites·20 claims
- 1595US7557420B2Low temperature process for polysilazane oxidation/densificationMICRON TECHNOLOGY INC·Filed 2005·Granted Jul 7, 2009·25 cites·45 claims
- 1694US10903109B2Methods of forming high aspect ratio openings and methods of forming high aspect ratio featuresMICRON TECHNOLOGY INC·Filed 2017·Granted Jan 26, 2021·9 cites·18 claims
- 1794US7439157B2Isolation trenches for memory devicesMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 21, 2008·24 cites·85 claims
- 1893US11476251B2Channel integration in a three-node access device for vertical three dimensional (3D) memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 18, 2022·3 cites·43 claims
- 1993US8735211B2Resistive RAM devices and methodsGREELEY JOSEPH N·Filed 2012·Granted May 27, 2014·13 cites·26 claims
- 2093US8211803B2Spacer process for on pitch contacts and related structuresSANDHU GURTEJ·Filed 2010·Granted Jul 3, 2012·12 cites·11 claims
- 2193US7851307B2Method of forming complex oxide nanodots for a charge trapMICRON TECHNOLOGY INC·Filed 2007·Granted Dec 14, 2010·19 cites·26 claims
- 2293US7785978B2Method of forming memory cell using gas cluster ion beamsMICRON TECHNOLOGY INC·Filed 2009·Granted Aug 31, 2010·26 cites·21 claims
- 2392US8598560B1Resistive memory elements exhibiting increased interfacial adhesion strength, methods of forming the same, and related resistive memory cells and memory devicesMILOJEVIC MARKO·Filed 2012·Granted Dec 3, 2013·24 cites·22 claims
- 2492US8575040B2Low temperature process for polysilazane oxidation/densificationFUCSKO JANOS·Filed 2009·Granted Nov 5, 2013·18 cites·29 claims
- 2592US8409915B2Methods of forming memory cellsSMYTHE JOHN·Filed 2010·Granted Apr 2, 2013·14 cites·18 claims
- 2691US10770465B1Method used in forming integrated circuitryMICRON TECHNOLOGY INC·Filed 2019·Granted Sep 8, 2020·7 cites·34 claims
- 2790US6190973B1Method of fabricating a high quality thin oxideZILOG INC·Filed 1998·Granted Feb 20, 2001·97 cites·28 claims
- 2889US12015089B2Transistors comprising two-dimensional materials and related memory cells and electronic devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 18, 2024·1 cites·19 claims
- 2989US11715692B2Microelectronic devices including conductive rails, and related methodsMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 1, 2023·2 cites·16 claims
- 3089US9576904B2Semiconductor devices comprising interconnect structures and methods of fabricationMICRON TECHNOLOGY INC·Filed 2015·Granted Feb 21, 2017·5 cites·18 claims
- 3189US8691622B2Memory cells and methods of forming memory cellsSMYTHE JOHN·Filed 2012·Granted Apr 8, 2014·8 cites·29 claims
- 3289US7928577B2Interconnect structures for integration of multi-layered integrated circuit devices and methods for forming the sameMICRON TECHNOLOGY INC·Filed 2008·Granted Apr 19, 2011·12 cites·22 claims
- 3389US6165846AMethod of eliminating gate leakage in nitrogen annealed oxidesZILOG INC·Filed 1999·Granted Dec 26, 2000·90 cites·42 claims
- 3488US8034655B2Non-volatile resistive oxide memory cells, non-volatile resistive oxide memory arrays, and methods of forming non-volatile resistive oxide memory cells and memory arraysMICRON TECHNOLOGY INC·Filed 2008·Granted Oct 11, 2011·17 cites·17 claims
- 3588US7112513B2Sub-micron space liner and densification processMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 26, 2006·37 cites·49 claims
- 3687US9634250B2Resistive RAM devices and methodsMICRON TECHNOLOGY INC·Filed 2016·Granted Apr 25, 2017·3 cites·20 claims
- 3786US8686535B2Trench isolation implantationSANDHU GURTEJ S·Filed 2010·Granted Apr 1, 2014·6 cites·19 claims
- 3886US8324065B2Resistive memory and methods of processing resistive memorySANDHU GURTEJ S·Filed 2011·Granted Dec 4, 2012·5 cites·22 claims
- 3986US7709345B2Trench isolation implantationMICRON TECHNOLOGY INC·Filed 2006·Granted May 4, 2010·11 cites·16 claims
- 4086US7557047B2Method of forming a layer of material using an atomic layer deposition processMICRON TECHNOLOGY INC·Filed 2006·Granted Jul 7, 2009·6 cites·11 claims
- 4185US11329051B2Gate dielectric repair on three-node access device formation for vertical three-dimensional (3D) memoryMICRON TECHNOLOGY INC·Filed 2020·Granted May 10, 2022·2 cites·23 claims
- 4285US10504917B2Arrays of elevationally-extending strings of memory cells and methods of forming memory arraysMICRON TECHNOLOGY INC·Filed 2018·Granted Dec 10, 2019·3 cites·31 claims
- 4385US8415661B2Methods of self-aligned growth of chalcogenide memory access deviceGREELEY NEIL·Filed 2012·Granted Apr 9, 2013·5 cites·19 claims
- 4485US7273796B2Methods of forming trench isolation in the fabrication of integrated circuitry and methods of fabricating integrated circuitryMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 25, 2007·11 cites·67 claims
- 4584US11121258B2Transistors comprising two-dimensional materials and related semiconductor devices, systems, and methodsMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 14, 2021·2 cites·34 claims
- 4684US9577186B2Non-volatile resistive oxide memory cells and methods of forming non-volatile resistive oxide memory cellsSRINIVASAN BHASKAR·Filed 2012·Granted Feb 21, 2017·4 cites·14 claims
- 4784US7919829B2Liner for shallow trench isolationMICRON TECHNOLOGY INC·Filed 2007·Granted Apr 5, 2011·9 cites·9 claims
- 4884US7271463B2Trench insulation structures including an oxide liner that is thinner along the walls of the trench than along the baseMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 18, 2007·27 cites·37 claims
- 4984US6642112B1Non-oxidizing spacer densification method for manufacturing semiconductor devicesZILOG INC·Filed 2001·Granted Nov 4, 2003·32 cites·14 claims
- 5083US10964532B2Methods of forming semiconductor devices comprising silicon nitride on high aspect ratio featuresMICRON TECHNOLOGY INC·Filed 2017·Granted Mar 30, 2021·2 cites·20 claims
Showing the top 50 of 155 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →