Inventor · disambiguated record
Joonseo Song
Also filed as: SONG JOONSEO
2 granted patents·1 pending application·1 citations·filing 2017–2023
30Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0168US11004712B2Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted May 11, 2021·1 cites·20 claims
- 0253US2024248051A1Wafer measurement apparatus and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0340US10269111B2Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Apr 23, 2019·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →