Inventor · disambiguated record
Joel R. Stanford
Also filed as: STANFORD JOEL R
2 granted patents·48 citations·filing 1997–1998
62Inventor score
Files withADVANCED MICRO DEVICES INC2
Top patents by PatentIndex Score
2 records- 0172US6005915AApparatus and method for measuring the roughness of a target material surface based upon the scattering of incident X-ray photonsADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 21, 1999·42 cites·24 claims
- 0227US6211685B1Surface probe for determining physical properties of a semiconductor deviceADVANCED MICRO DEVICES INC·Filed 1998·Granted Apr 3, 2001·6 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →