Inventor · disambiguated record
Joel O'Don Stevenson
Also filed as: STEVENSON JOEL O · STEVENSON JOEL O'DON
22 granted patents·3 pending applications·653 citations·filing 1990–2002
97Inventor score
Top patents by PatentIndex Score
25 records- 0193US6077386AMethod and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Jun 20, 2000·152 cites·45 claims
- 0278US6805810B2Method & apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 2002·Granted Oct 19, 2004·21 cites·18 claims
- 0378US6090302AMethod and apparatus for monitoring plasma processing operationsSANDIA·Filed 1998·Granted Jul 18, 2000·61 cites·14 claims
- 0476US6383402B1Method and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1999·Granted May 7, 2002·47 cites·29 claims
- 0576US6246473B1Method and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Jun 12, 2001·47 cites·20 claims
- 0669US6123983AMethod and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Sep 26, 2000·37 cites·22 claims
- 0767US6769288B2Method and assembly for detecting a leak in a plasma systemPEAK SENSOR SYSTEMS LLC·Filed 2002·Granted Aug 3, 2004·12 cites·33 claims
- 0866US6419801B1Method and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Jul 16, 2002·24 cites·11 claims
- 0963US6261470B1Method and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Jul 17, 2001·31 cites·18 claims
- 1062US6275740B1Method and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Aug 14, 2001·28 cites·36 claims
- 1161US6134005AMethod and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Oct 17, 2000·27 cites·50 claims
- 1260US6132577AMethod and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Oct 17, 2000·26 cites·24 claims
- 1355US6165312AMethod and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Dec 26, 2000·22 cites·23 claims
- 1454US6192826B1Method and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Feb 27, 2001·21 cites·23 claims
- 1551US6223755B1Method and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted May 1, 2001·18 cites·22 claims
- 1650US6269278B1Method and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Jul 31, 2001·17 cites·36 claims
- 1744US6157447AMethod and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Dec 5, 2000·12 cites·65 claims
- 1843US6221679B1Method and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Apr 24, 2001·12 cites·28 claims
- 1942US6254717B1Method and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Jul 3, 2001·12 cites·24 claims
- 2042US4995954APorous siliconformation and etching process for use in silicon micromachiningUS ENERGY·Filed 1990·Granted Feb 26, 1991·15 cites·8 claims
- 2141US2003136663A1Method and apparatus for monitoring plasma processing operationsFiled 2002·Application pending·0 cites
- 2241US2003024810A1Method & apparatus for monitoring plasma processing operationsFiled 2002·Application pending·0 cites
- 2341US2003029720A1Method & apparatus for monitoring plasma processing operationsFiled 2002·Application pending·0 cites
- 2437US6169933B1Method and apparatus for monitoring plasma processing operationsSANDIA CORP·Filed 1998·Granted Jan 2, 2001·8 cites·26 claims
- 2530US5015346AElectrochemical method for defect delineation in silicon-on-insulator wafersUS ENERGY·Filed 1990·Granted May 14, 1991·3 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →