Inventor · disambiguated record
Jongcheon Sun
Also filed as: SUN JONGCHEON
1 granted patent·3 pending applications·0 citations·filing 2023–2025
5Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0159US2025218721A1Scanning electron microscope deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0258US12352808B2Substrate inspection apparatus and substrate inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jul 8, 2025·0 cites·20 claims
- 0356US2025037486A1Method of generating defect classification modelSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0451US2025231121A1Wafer inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →