Inventor · disambiguated record
Jong-Cheon Sun
Also filed as: SUN JONG CHEON
1 granted patent·4 pending applications·1 citations·filing 2013–2023
17Inventor score
Files withSAMSUNG ELECTRONICS CO LTD5
Top patents by PatentIndex Score
5 records- 0162US2024412943A1Substrate inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0256US8890069B2Method for detecting defect of substrateSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Nov 18, 2014·1 cites·19 claims
- 0347US2023266258A1Method of inspecting semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0437US2014307052A1Apparatuses and methods for extracting defect depth information and methods of improving semiconductor device manufacturing processes using defect depth informationSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 0535US2014268170A1Apparatus and method for estimating depth of buried defect in substrateSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →