Inventor · disambiguated record
Joven R. Tienzo
Also filed as: TIENZO JOVEN R
16 granted patents·3 pending applications·129 citations·filing 2008–2022
92Inventor score
Top patents by PatentIndex Score
19 records- 0198US10908207B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2016·Granted Feb 2, 2021·31 cites·4 claims
- 0298US10126356B2Systems and methods for conforming test tooling to integrated circuit device with whirlwind cold plateESSAI INC·Filed 2016·Granted Nov 13, 2018·30 cites·17 claims
- 0396US11378588B2Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2020·Granted Jul 5, 2022·3 cites·10 claims
- 0494US8508245B1Thermal control unit used to maintain the temperature of IC devices under testBARABI NASSER·Filed 2010·Granted Aug 13, 2013·21 cites·11 claims
- 0592US7663388B2Active thermal control unit for maintaining the set point temperature of a DUTESSAI INC·Filed 2008·Granted Feb 16, 2010·26 cites·16 claims
- 0687US9804223B2Systems and methods for conforming test tooling to integrated circuit device with heater socketESSAI INC·Filed 2015·Granted Oct 31, 2017·4 cites·19 claims
- 0781US11293976B1Integrated circuit device test tooling with dual angle cavitiesESSAI INC·Filed 2020·Granted Apr 5, 2022·1 cites·7 claims
- 0879US9007080B2Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature controlESSAI INC·Filed 2013·Granted Apr 14, 2015·4 cites·11 claims
- 0975US8653842B2Systems and methods for thermal control of integrated circuits during testingBARABI NASSER·Filed 2011·Granted Feb 18, 2014·2 cites·9 claims
- 1073US9383406B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2014·Granted Jul 5, 2016·2 cites·3 claims
- 1172US2022413010A1Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2022·Application pending·0 cites
- 1270US8981802B2Systems and methods for conforming device testers to integrated circuit device profilesBARABI NASSER·Filed 2012·Granted Mar 17, 2015·3 cites·11 claims
- 1368US9494642B2Systems and methods for conforming test tooling to integrated circuit device profiles with ejection mechanismsESSAI INC·Filed 2013·Granted Nov 15, 2016·2 cites·8 claims
- 1452US9557373B2Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structureESSAI INC·Filed 2014·Granted Jan 31, 2017·0 cites·12 claims
- 1546US9229049B2Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestalsESSAI INC·Filed 2013·Granted Jan 5, 2016·0 cites·12 claims
- 1645US2015022226A1Systems and methods for conforming test tooling to integrated circuit device profiles with coaxial socketESSAI INC·Filed 2014·Application pending·0 cites
- 1743US10094853B2Systems and methods for reliable integrated circuit device test toolingESSAI INC·Filed 2015·Granted Oct 9, 2018·0 cites·14 claims
- 1843US9279852B2Systems and methods for conforming test tooling to integrated circuit device profiles with sockets having secured and replaceable bushingsESSAI INC·Filed 2013·Granted Mar 8, 2016·0 cites·2 claims
- 1941US2020379010A1Systems and methods for high speed test probing of densely packaged semiconductor devicesESSAI INC·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →