Inventor · disambiguated record
Joaquin Torres
Also filed as: TORRES JOAQUIN
17 granted patents·7 pending applications·256 citations·filing 2001–2013
94Inventor score
Files withST MICROELECTRONICS CROLLES 25ST MICROELECTRONICS SA5TORRES JOAQUIN5JOURDAN NICOLAS2NXP BV2
Top patents by PatentIndex Score
24 records- 0194US6828646B2Isolating trench and manufacturing processST MICROELECTRONICS SA·Filed 2002·Granted Dec 7, 2004·96 cites·21 claims
- 0285US7172980B2Process for fabricating an integrated electronic circuit that incorporates air gapsKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Feb 6, 2007·46 cites·12 claims
- 0383US8470685B2Integration of self-aligned trenches in-between metal linesTORRES JOAQUIN·Filed 2007·Granted Jun 25, 2013·14 cites·11 claims
- 0482US8072075B2CuSiN/SiN diffusion barrier for copper in integrated-circuit devicesJOURDAN NICOLAS·Filed 2007·Granted Dec 6, 2011·20 cites·15 claims
- 0579US8399772B2Control of carbon nanostructure growth in an interconnect structureGOSSET LAURENT·Filed 2007·Granted Mar 19, 2013·10 cites·20 claims
- 0678US8110879B2Controlling lateral distribution of air gaps in interconnectsTORRES JOAQUIN·Filed 2009·Granted Feb 7, 2012·7 cites·15 claims
- 0778US6846690B2Integrated circuit comprising an auxiliary component, for example a passive component or a microelectromechanical system, placed above an electronic chip, and the corresponding fabrication processST MICROELECTRONICS SA·Filed 2002·Granted Jan 25, 2005·26 cites·15 claims
- 0876US8138082B2Method for forming metal interconnects in a dielectric materialTORRES JOAQUIN·Filed 2007·Granted Mar 20, 2012·8 cites·19 claims
- 0970US8729701B2Copper diffusion barrierJOURDAN NICOLAS·Filed 2010·Granted May 20, 2014·3 cites·23 claims
- 1068US7816266B2Copper diffusion barrierST MICROELECTRONICS CROLLES 2·Filed 2007·Granted Oct 19, 2010·4 cites·17 claims
- 1166US7605071B2Controlling lateral distribution of air gaps in interconnectsST MICROELECTRONICS CROLLES 2·Filed 2006·Granted Oct 20, 2009·3 cites·18 claims
- 1265US7630191B2MIM capacitorST MICROELECTRONICS CROLLES 2·Filed 2007·Granted Dec 8, 2009·3 cites·15 claims
- 1363US8143157B2Fabrication of a diffusion barrier cap on copper containing conductive elementsTORRES JOAQUIN·Filed 2007·Granted Mar 27, 2012·3 cites·11 claims
- 1459US8424177B2MIM capacitor with enhanced capacitanceFARCY ALEXIS·Filed 2010·Granted Apr 23, 2013·2 cites·10 claims
- 1555US7553739B2Integration control and reliability enhancement of interconnect air cavitiesSTMICROELECTRONICS CORLLES 2 S·Filed 2006·Granted Jun 30, 2009·2 cites·21 claims
- 1655US6528419B1Process of fabricating an integrated circuitST MICROELECTRONICS SA·Filed 2001·Granted Mar 4, 2003·9 cites·13 claims
- 1749US2008179750A1Interconnections of an integrated electronic circuitST MICROELECTRONICS SA·Filed 2008·Application pending·0 cites
- 1845US2010059889A1Adhesion of diffusion barrier on copper-containing interconnect elementNXP BV·Filed 2007·Application pending·0 cites
- 1944US7989342B2Formation of a reliable diffusion-barrier cap on a Cu-containing interconnect element having grains with different crystal orientationsTORRES JOAQUIN·Filed 2008·Granted Aug 2, 2011·0 cites·8 claims
- 2044US2013286540A1Mim capacitorNXP B V DUTCH CORP·Filed 2013·Application pending·0 cites
- 2144US2010323477A1Interconnections of an integrated electronic circuitST MICROELECTRONICS SA·Filed 2010·Application pending·0 cites
- 2242US2009051033A1Reliability improvement of metal-interconnect structure by capping spacersNXP BV·Filed 2006·Application pending·0 cites
- 2339US2007063240A1Integrated electronic circuit incorporating a capacitorST MICROELECTRONICS CROLLES 2·Filed 2006·Application pending·0 cites
- 2438US2007096253A1Integrated capacitor with a high breakdown voltageST MICROELECTRONICS CROLLES 2·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →