Inventor · disambiguated record
Jon Karl Weiss
Also filed as: WEISS JON KARL
4 granted patents·4 citations·filing 2012–2019
60Inventor score
Technology areasH01J
Top patents by PatentIndex Score
4 records- 0159US9274070B2System and process for measuring strain in materials at high spatial resolutionAppFive LLC·Filed 2013·Granted Mar 1, 2016·3 cites·37 claims
- 0251US9406496B2Method and system for improving characteristic peak signals in analytical electron microscopyUNIV BARCELONA·Filed 2012·Granted Aug 2, 2016·1 cites·23 claims
- 0337US10811216B2Method for automatically aligning a scanning transmission electron microscope for precession electron diffraction data mappingTESCAN BRNO S R O·Filed 2019·Granted Oct 20, 2020·0 cites·12 claims
- 0434US10636622B2Scanning transmission electron microscopeTESCAN BRNO S R O·Filed 2018·Granted Apr 28, 2020·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →