Inventor · disambiguated record
John J. Zasio
Also filed as: SAMUELS MICHAEL W · ZASIO JOHN · ZASIO JOHN J
28 granted patents·1,089 citations·filing 1973–2000
97Inventor score
Files withFUJITSU LTD9STORAGE TECHNOLOGY PARTNERS8AMDAHL CORP4ALPINE MICROSYSTEMS INC2HAL COMPUTER SYSTEMS INC2
Top patents by PatentIndex Score
28 records- 0198US4495629ACMOS scannable latchSTORAGE TECHNOLOGY PARTNERS·Filed 1983·Granted Jan 22, 1985·210 cites·12 claims
- 0294US4495628ACMOS LSI and VLSI chips having internal delay testing capabilitySTORAGE TECHNOLOGY PARTNERS·Filed 1982·Granted Jan 22, 1985·70 cites·9 claims
- 0394US4414480ACMOS Circuit using transmission line interconnectionsSTORAGE TECHNOLOGY PARTNERS·Filed 1981·Granted Nov 8, 1983·78 cites·12 claims
- 0491US4924430AStatic timing analysis of semiconductor digital circuitsTERADYNE INC·Filed 1988·Granted May 8, 1990·174 cites·11 claims
- 0589US6300161B1Module and method for interconnecting integrated circuits that facilitates high speed signal propagation with reduced noiseALPINE MICROSYSTEMS INC·Filed 2000·Granted Oct 9, 2001·58 cites·15 claims
- 0688US4587480ADelay testing method for CMOS LSI and VLSI integrated circuitsSTORAGE TECHNOLOGY PARTNERS·Filed 1984·Granted May 6, 1986·47 cites·3 claims
- 0788US4442361ASystem and method for calibrating electron beam systemsSTORAGE TECHNOLOGY PARTNERS·Filed 1982·Granted Apr 10, 1984·34 cites·17 claims
- 0887US4132898AOverlapping boundary electron exposure system method and apparatusFUJITSU LTD·Filed 1977·Granted Jan 2, 1979·25 cites·18 claims
- 0985US4504783ATest fixture for providing electrical access to each I/O pin of a VLSI chip having a large number of I/O pinsSTORAGE TECHNOLOGY PARTNERS·Filed 1982·Granted Mar 12, 1985·54 cites·9 claims
- 1084US4782283AApparatus for scan testing CMOS integrated systemsAIDA CORP·Filed 1986·Granted Nov 1, 1988·50 cites·7 claims
- 1181US4553236ASystem for detecting and correcting errors in a CMOS computer systemSTORAGE TECHNOLOGY PARTNERS·Filed 1984·Granted Nov 12, 1985·24 cites·4 claims
- 1281US4147937AElectron beam exposure system method and apparatusFUJITSU LTD·Filed 1977·Granted Apr 3, 1979·19 cites·24 claims
- 1378US4191916ATable positioning system including optical reference position measuring transducerFUJITSU LTD·Filed 1977·Granted Mar 4, 1980·23 cites·18 claims
- 1477US4016463AHigh density multilayer printed circuit card assembly and methodAMDAHL CORP·Filed 1973·Granted Apr 5, 1977·24 cites·4 claims
- 1576US4937770ASimulation systemTERADYNE INC·Filed 1988·Granted Jun 26, 1990·59 cites·14 claims
- 1673US4115837ALSI Chip package and methodAMDAHL CORP·Filed 1974·Granted Sep 19, 1978·19 cites·11 claims
- 1771US4420691AMethod of aligning electron beam apparatusFUJITSU LTD·Filed 1978·Granted Dec 13, 1983·12 cites·6 claims
- 1863US3981070ALSI chip construction and methodAMDAHL CORP·Filed 1974·Granted Sep 21, 1976·13 cites·20 claims
- 1947US5095356ACellular integrated circuit and hierarchical methodFUJITSU LTD·Filed 1990·Granted Mar 10, 1992·19 cites·11 claims
- 2047US4396971ALSI Chip package and methodAMDAHL CORP·Filed 1977·Granted Aug 2, 1983·11 cites·18 claims
- 2147US4350866ADischarge device and method for use in processing semiconductor devicesFUJITSU LTD·Filed 1979·Granted Sep 21, 1982·10 cites·2 claims
- 2246US4969029ACellular integrated circuit and hierarchial methodFUJITSU LTD·Filed 1987·Granted Nov 6, 1990·15 cites·4 claims
- 2343US5541528ACMOS buffer circuit having increased speedHAL COMPUTER SYSTEMS INC·Filed 1995·Granted Jul 30, 1996·8 cites·27 claims
- 2441US4737933ACMOS multiport general purpose registerSTORAGE TECHNOLOGY PARTNERS·Filed 1983·Granted Apr 12, 1988·14 cites·16 claims
- 2539US4180772ALarge-scale integrated circuit with integral bi-directional test circuitFUJITSU LTD·Filed 1977·Granted Dec 25, 1979·8 cites·10 claims
- 2635US5570036ACMOS buffer circuit having power-down featureHAL COMPUTER SYSTEMS INC·Filed 1995·Granted Oct 29, 1996·3 cites·5 claims
- 2732US6337576B1Wafer-level burn-inALPINE MICROSYSTEMS INC·Filed 1999·Granted Jan 8, 2002·5 cites·26 claims
- 2831US4458129ADischarge device and method for use in processing semiconductor devicesFUJITSU LTD·Filed 1982·Granted Jul 3, 1984·3 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →