Inventor · disambiguated record
Justin R. Arrington
Also filed as: ARRINGTON JUSTIN R
10 granted patents·2 pending applications·68 citations·filing 2003–2013
88Inventor score
Top patents by PatentIndex Score
12 records- 0191US8026501B2Method of removing or deposting material on a surface including material selected to decorate a particle on the surface for imagingMICRON TECHNOLOGY INC·Filed 2010·Granted Sep 27, 2011·10 cites·30 claims
- 0289US7791055B2Electron induced chemical etching/deposition for enhanced detection of surface defectsMICRON TECHNOLOGY INC·Filed 2006·Granted Sep 7, 2010·14 cites·18 claims
- 0388US7791071B2Profiling solid state samplesMICRON TECHNOLOGY INC·Filed 2006·Granted Sep 7, 2010·10 cites·15 claims
- 0487US7892978B2Electron induced chemical etching for device level diagnosisMICRON TECHNOLOGY INC·Filed 2006·Granted Feb 22, 2011·10 cites·29 claims
- 0586US7807062B2Electron induced chemical etching and deposition for local circuit repairMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 5, 2010·10 cites·28 claims
- 0684US8389415B2Profiling solid state samplesRUEGER NEAL R·Filed 2010·Granted Mar 5, 2013·5 cites·23 claims
- 0768US8609542B2Profiling solid state samplesMICRON TECHNOLOGY INC·Filed 2013·Granted Dec 17, 2013·1 cites·20 claims
- 0867US8809074B2Method for integrated circuit diagnosisMICRON TECHNOLOGY INC·Filed 2013·Granted Aug 19, 2014·1 cites·20 claims
- 0951US6819125B1Method and apparatus for integrated circuit failure analysisMICRON TECHNOLOGY INC·Filed 2003·Granted Nov 16, 2004·7 cites·30 claims
- 1042US2011139368A1Apparatus and systems for integrated circuit diagnosisWILLIAMSON MARK J·Filed 2011·Application pending·0 cites
- 1140US8821682B2Electron induced chemical etching and deposition for local circuit repairWILLIAMSON MARK J·Filed 2010·Granted Sep 2, 2014·0 cites·20 claims
- 1239US2007278180A1Electron induced chemical etching for materials characterizationWILLIAMSON MARK J·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →