Inventor · disambiguated record
Jung-Hoon Bak
Also filed as: BAK JUNG-HOON
7 granted patents·20 citations·filing 2016–2022
78Inventor score
Top patents by PatentIndex Score
7 records- 0188US10833250B2Magnetoresistive random access memory device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 10, 2020·5 cites·20 claims
- 0288US10056543B2Magnetoresistive random access memory device having magnetic tunnel junction and method of manufacturing the sameBAK JUNG HOON·Filed 2016·Granted Aug 21, 2018·10 cites·19 claims
- 0382US10043966B2Semiconductor device including via plugsSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Aug 7, 2018·5 cites·15 claims
- 0469US11462679B2Magnetoresistive random access memory device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Oct 4, 2022·0 cites·13 claims
- 0555US12282317B2Wafer defect test apparatus, wafer defect test system, wafer test method and fabrication method of a waferSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Apr 22, 2025·0 cites·19 claims
- 0646US10355200B2Semiconductor device and electronic system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jul 16, 2019·0 cites·19 claims
- 0741US10109676B2MTJ structures including magnetism induction pattern and magnetoresistive random access memory devices including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Oct 23, 2018·0 cites·13 claims
Join the waitlist — get patent alerts
Get an alert when Jung-Hoon Bak files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →