Inventor · disambiguated record
Jung-Hoon Byun
Also filed as: BYUN JUNG-HOON
2 granted patents·3 pending applications·4 citations·filing 2004–2016
44Inventor score
Top patents by PatentIndex Score
5 records- 0177US9322771B2Apparatus and method for monitoring semiconductor fabrication processes using polarized lightSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Apr 26, 2016·4 cites·18 claims
- 0244US9551653B2Methods for monitoring semiconductor fabrication processes using polarized lightSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jan 24, 2017·0 cites·14 claims
- 0336US2007246446A1Continous Butt Welding Method Using Plasma and Laser, and Method for Fabricating Metal Tube Using the SameLEE SANG-HOON·Filed 2004·Application pending·0 cites
- 0432US2012082367A1Method of forming image of semiconductor device, and method of detecting a defect of the semiconductor device by using the image forming methodBYUN JUNG-HOON·Filed 2011·Application pending·0 cites
- 0531US2015355108A1Inspection system and methods of fabricating and inspecting semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →