Inventor · disambiguated record
Juan Manuel Cesaretti
Also filed as: CESARETTI JUAN MANUEL
32 granted patents·2 pending applications·509 citations·filing 2010–2024
97Inventor score
Top patents by PatentIndex Score
34 records- 0198US10636285B2Sensor integrated circuits and methods for safety critical applicationsALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Apr 28, 2020·32 cites·27 claims
- 0298US9201122B2Circuits and methods using adjustable feedback for self-calibrating or self-testing a magnetic field sensor with an adjustable time constantCESARETTI JUAN MANUEL·Filed 2012·Granted Dec 1, 2015·60 cites·50 claims
- 0398US8692546B2Circuits and methods for generating a diagnostic mode of operation in a magnetic field sensorALLEGRO MICROSYSTEMS LLC·Filed 2013·Granted Apr 8, 2014·51 cites·31 claims
- 0498US8680846B2Circuits and methods for self-calibrating or self-testing a magnetic field sensorCESARETTI JUAN MANUEL·Filed 2011·Granted Mar 25, 2014·104 cites·62 claims
- 0598US8542010B2Circuits and methods for generating a diagnostic mode of operation in a magnetic field sensorCESARETTI JUAN MANUEL·Filed 2010·Granted Sep 24, 2013·106 cites·23 claims
- 0697US10580289B2Sensor integrated circuits and methods for safety critical applicationsALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Mar 3, 2020·13 cites·29 claims
- 0797US10380879B2Sensor integrated circuits and methods for safety critical applicationsALLEGRO MICROSYSTEMS LLC·Filed 2017·Granted Aug 13, 2019·22 cites·35 claims
- 0896US10520559B2Arrangements for Hall effect elements and vertical epi resistors upon a substrateALLEGRO MICROSYSTEMS LLC·Filed 2017·Granted Dec 31, 2019·11 cites·21 claims
- 0996US9638764B2Electronic circuit for driving a hall effect element with a current compensated for substrate stressALLEGRO MICROSYSTEMS LLC·Filed 2015·Granted May 2, 2017·17 cites·25 claims
- 1095US10162017B2Systems and methods for reducing high order hall plate sensitivity temperature coefficientsALLEGRO MICROSYSTEMS LLC·Filed 2016·Granted Dec 25, 2018·11 cites·21 claims
- 1195US9551762B1Circuits and methods for removing a gain offset in a magnetic field sensorALLEGRO MICROSYSTEMS LLC·Filed 2015·Granted Jan 24, 2017·12 cites·23 claims
- 1294US10852161B2Magnetic field angle sensor having a low power mode and associated methodsALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Dec 1, 2020·8 cites·22 claims
- 1394US9645220B2Circuits and methods for self-calibrating or self-testing a magnetic field sensor using phase discriminationALLEGRO MICROSYSTEMS LLC·Filed 2014·Granted May 9, 2017·17 cites·34 claims
- 1492US10746818B2Systems and methods for reducing high order hall plate sensitivity temperature coefficientsALLEGRO MICROSYSTEMS LLC·Filed 2018·Granted Aug 18, 2020·4 cites·20 claims
- 1592US10254354B2Electronic circuit for compensating a sensitivity drift of a hall effect element due to stressALLEGRO MICROSYSTEMS LLC·Filed 2018·Granted Apr 9, 2019·7 cites·23 claims
- 1692US10107873B2Electronic circuit for compensating a sensitivity drift of a hall effect element due to stressALLEGRO MICROSYSTEMS LLC·Filed 2016·Granted Oct 23, 2018·8 cites·21 claims
- 1791US10430296B2Circuit and method for storing information in non-volatile memory during a loss of power eventALLEGRO MICROSYSTEMS LLC·Filed 2017·Granted Oct 1, 2019·6 cites·12 claims
- 1890US12063046B2Oscillator monitoring circuits for different oscillator domainsALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Aug 13, 2024·2 cites·34 claims
- 1990US11733024B2Use of channel information to generate redundant angle measurements on safety critical applicationsALLEGRO MICROSYSTEMS LLC·Filed 2021·Granted Aug 22, 2023·2 cites·18 claims
- 2086US11175160B2Magnetic field sensor and method with reduced distortion measurement in sideshaft applicationsALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Nov 16, 2021·4 cites·15 claims
- 2184US11624799B2Method and apparatus for detecting errors in a magnetic field sensorALLEGRO MICROSYSTEMS LLC·Filed 2021·Granted Apr 11, 2023·2 cites·25 claims
- 2284US11555868B2Electronic circuit having vertical hall elements arranged on a substrate to reduce an orthogonality errorALLEGRO MICROSYSTEMS LLC·Filed 2021·Granted Jan 17, 2023·1 cites·26 claims
- 2380US11848682B2Diagnostic circuits and methods for analog-to-digital convertersALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Dec 19, 2023·1 cites·25 claims
- 2480US10325836B1Integrated circuit with connectivity error detectionALLEGRO MICROSYSTEMS LLC·Filed 2018·Granted Jun 18, 2019·3 cites·18 claims
- 2570US10839920B2Circuit having a low power charge pump for storing information in non-volatile memory during a loss of power eventALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Nov 17, 2020·4 cites·20 claims
- 2669US12455301B2Hall plate current sensor having stress compensationALLEGRO MICROSYSTEMS LLC·Filed 2023·Granted Oct 28, 2025·0 cites·21 claims
- 2769US12367135B1Circuit having start up trimmingALLEGRO MICROSYSTEMS LLC·Filed 2024·Granted Jul 22, 2025·0 cites·18 claims
- 2867US11402280B2Magnetic sensor with improved stress compensation accounting for temperatureALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Aug 2, 2022·1 cites·20 claims
- 2966US11467928B2Circuit and method for storing information in non-volatile memory during a loss of power eventALLEGRO MICROSYSTEMS LLC·Filed 2021·Granted Oct 11, 2022·0 cites·5 claims
- 3059US2025321299A1Magnetic field sensors with current mode offset averagingALLEGRO MICROSYSTEMS LLC·Filed 2024·Application pending·0 cites
- 3157US2025334652A1Cyclic channel self evaluationALLEGRO MICROSYSTEMS LLC·Filed 2024·Application pending·0 cites
- 3253US10929252B2Circuit and method for storing information in non-volatile memory during a loss of power eventALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Feb 23, 2021·0 cites·6 claims
- 3342US10006970B2Electronic comparison circuit to identify at least three conditions of an input signalALLEGRO MICROSYSTEMS LLC·Filed 2015·Granted Jun 26, 2018·0 cites·41 claims
- 3436US10608168B2Isolated hall effect element with improved electro-magnetic isolationALLEGRO MICROSYSTEMS LLC·Filed 2017·Granted Mar 31, 2020·0 cites·34 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →