Inventor · disambiguated record
Jungkee Choi
Also filed as: CHOI JUNGKEE
1 granted patent·1 pending application·0 citations·filing 2023–2023
8Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0155US2024193755A1Pattern defect inspection device and pattern defect inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0252US12438054B2Semiconductor device including a macro pattern structure for monitoring of line widthsSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Oct 7, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →