Inventor · disambiguated record
Jung-Hsiang Chuang
Also filed as: CHUANG JUNG-HSIANG
3 granted patents·15 citations·filing 2003–2018
62Inventor score
Top patents by PatentIndex Score
3 records- 0173US10679820B2Inspection method for wafer or DUTTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 9, 2020·2 cites·20 claims
- 0259US6930502B2Method using conductive atomic force microscopy to measure contact leakage currentTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Aug 16, 2005·13 cites·18 claims
- 0347US10141158B2Wafer and DUT inspection apparatus and method using thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Nov 27, 2018·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Jung-Hsiang Chuang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →