Inventor · disambiguated record
Junichi Hirase
Also filed as: HIRASE JUNICHI
3 granted patents·49 citations·filing 1997–1999
71Inventor score
Technology areasG01R
Top patents by PatentIndex Score
3 records- 0160US6351834B1Apparatus for testing semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Feb 26, 2002·28 cites·5 claims
- 0244US5901154AMethod for producing test program for semiconductor deviceMATASUSHITA ELECTRIC IND CO LT·Filed 1997·Granted May 4, 1999·16 cites·18 claims
- 0328US5894424ASemiconductor testing apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Apr 13, 1999·5 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →