Inventor · disambiguated record
Jung Hur
Also filed as: HUR JUNG · HUR JUNG-UK
15 granted patents·7 pending applications·29 citations·filing 2004–2024
91Inventor score
Top patents by PatentIndex Score
22 records- 0195US11360031B2Focus-less inspection apparatus and methodKOH YOUNG TECH INC·Filed 2020·Granted Jun 14, 2022·3 cites·10 claims
- 0290US11821846B2Focus-less inspection apparatus and methodKOH YOUNG TECH INC·Filed 2022·Granted Nov 21, 2023·1 cites·10 claims
- 0390US10890538B2Focus-less inspection apparatus and methodKOH YOUNG TECH INC·Filed 2019·Granted Jan 12, 2021·4 cites·19 claims
- 0486US10359276B2Apparatus and method for measuring a three dimensional shapeKOH YOUNG TECH INC·Filed 2016·Granted Jul 23, 2019·3 cites·11 claims
- 0586US2024426766A1Focus-less inspection apparatus and methodKOH YOUNG TECH INC·Filed 2024·Application pending·0 cites
- 0684US12105029B2Focus-less inspection apparatus and methodKOH YOUNG TECH INC·Filed 2023·Granted Oct 1, 2024·0 cites·7 claims
- 0784US9488472B2Apparatus and method for measuring a three dimensional shapeKOH YOUNG TECH INC·Filed 2014·Granted Nov 8, 2016·3 cites·7 claims
- 0884US9243900B2Apparatus and method for measuring a three dimensional shapeKOH YOUNG TECH INC·Filed 2014·Granted Jan 26, 2016·3 cites·9 claims
- 0983US2025067559A1Apparatus and method for measuring a three dimensional shapeKOH YOUNG TECH INC·Filed 2024·Application pending·0 cites
- 1082US8854610B2Apparatus and method for measuring a three-dimensional shapeLEE SEUNG-JUN·Filed 2009·Granted Oct 7, 2014·4 cites·4 claims
- 1181US10563978B2Apparatus and method for measuring a three dimensional shapeKOH YOUNG TECH INC·Filed 2019·Granted Feb 18, 2020·1 cites·20 claims
- 1278US9046498B2Board inspection apparatus using multiple camerasHONG JONG-KYU·Filed 2011·Granted Jun 2, 2015·4 cites·12 claims
- 1372US12163776B2Apparatus and method for measuring a three-dimensional shapeKOH YOUNG TECH INC·Filed 2021·Granted Dec 10, 2024·0 cites·11 claims
- 1468US10996050B2Apparatus and method for measuring a three dimensional shapeKOH YOUNG TECH INC·Filed 2020·Granted May 4, 2021·0 cites·20 claims
- 1568US2006234244A1System for analyzing bio chips using gene ontology and a method thereofKIM YANG-SUK·Filed 2004·Application pending·0 cites
- 1666US10883824B2Pattern light emitting device capable of having plurality of different pattern light sources installed thereon and inspection deviceKOH YOUNG TECH INC·Filed 2017·Granted Jan 5, 2021·1 cites·7 claims
- 1766US8670117B2Inspection apparatusHONG JONG-KYU·Filed 2011·Granted Mar 11, 2014·2 cites·10 claims
- 1858US2007143031A1Method of analyzing a bio chipISTECH CO LTD·Filed 2007·Application pending·0 cites
- 1952US2024174823A1Transparent stretchable structure having unidirectionally oriented nanostructures and method of manufacturing the sameKOREA INST SCI & TECH·Filed 2023·Application pending·0 cites
- 2042US2013314757A1Wavelength-changeable laser apparatus and tuning method using the sameKOH YOUNG TECH INC·Filed 2013·Application pending·0 cites
- 2139US2021254966A1Inspection apparatusKOH YOUNG TECH INC·Filed 2018·Application pending·0 cites
- 2233US8754936B2Three dimensional shape measurement apparatusHUR JUNG·Filed 2010·Granted Jun 17, 2014·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →