Inventor · disambiguated record
Jung-Hui Kao
Also filed as: KAO JUNG-HUI
19 granted patents·6 pending applications·236 citations·filing 1998–2025
93Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD13TAIWAN SEMICONDUCTOR MFG8CHUANG HARRY1NG JIN-AUN1TAIWAN SEMICONDUCTOR MANUFACTACTURING COMPANY LTD1
Top patents by PatentIndex Score
25 records- 0196US7157351B2Ozone vapor clean methodTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Jan 2, 2007·148 cites·18 claims
- 0295US12050245B2Semiconductor testing device and method of operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 30, 2024·2 cites·20 claims
- 0394US7898037B2Contact scheme for MOSFETsTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Mar 1, 2011·33 cites·13 claims
- 0487US8822283B2Self-aligned insulated film for high-k metal gate deviceNG JIN-AUN·Filed 2011·Granted Sep 2, 2014·7 cites·20 claims
- 0584US8286114B23-dimensional device design layoutCHUANG HARRY·Filed 2007·Granted Oct 9, 2012·12 cites·20 claims
- 0676US10388531B2Self-aligned insulated film for high-k metal gate deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Aug 20, 2019·1 cites·20 claims
- 0775US2024297171A1Semiconductor structure and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0875US2025318258A1Method of manufacturing a semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0974US10937785B2Semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 2, 2021·2 cites·8 claims
- 1071US12002807B2Semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 4, 2024·0 cites·20 claims
- 1169US12414361B2Method of manufacturing a semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 9, 2025·0 cites·20 claims
- 1269US7678636B2Selective formation of stress memorization layerTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Mar 16, 2010·4 cites·12 claims
- 1366US7632729B2Method for semiconductor device performance enhancementTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Dec 15, 2009·3 cites·16 claims
- 1465US11367721B2Semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 21, 2022·0 cites·20 claims
- 1565US11094545B2Self-aligned insulated film for high-K metal gate deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 17, 2021·0 cites·20 claims
- 1660US12243787B2Method of forming testing module and method for using the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Mar 4, 2025·0 cites·20 claims
- 1759US2025218793A1Semiconductor die and methods of formationTAIWAN SEMICONDUCTOR MANUFACTACTURING COMPANY LTD·Filed 2023·Application pending·0 cites
- 1858US9779947B2Self-aligned insulated film for high-k metal gate deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Oct 3, 2017·0 cites·20 claims
- 1957US9252224B2Self-aligned insulated film for high-k metal gate deviceTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 2, 2016·0 cites·20 claims
- 2055US6273099B1Simplified method for cleaning silicon wafers after application of laser marksTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Aug 14, 2001·19 cites·7 claims
- 2154US6427705B1Simplified method for cleaning silicon wafers after application of laser marksTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Aug 6, 2002·5 cites·2 claims
- 2253US11417649B2Semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Aug 16, 2022·0 cites·20 claims
- 2353US2024186235A1Integrated chip including a capacitor arrayTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2442US2005277262A1Method for manufacturing isolation structures in a semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2004·Application pending·0 cites
- 2539US2005118802A1Method for implementing poly pre-doping in deep sub-micron processFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →