Inventor · disambiguated record
Jun-Seuck Kim
Also filed as: KIM JUN · KIM JUN-DONG · KIM JUN-SEUCK
3 granted patents·7 pending applications·12 citations·filing 2001–2019
64Inventor score
Top patents by PatentIndex Score
10 records- 0184US11739010B2Electrodes for selective removal of multivalent ions through capacitive deionizationUNIV RICE WILLIAM M·Filed 2019·Granted Aug 29, 2023·3 cites·17 claims
- 0272US7368333B2Semiconductor device and method of manufacturing the same by using atomic layer depositionSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted May 6, 2008·6 cites·10 claims
- 0364US7351633B2Method of fabricating semiconductor device using selective epitaxial growthSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Apr 1, 2008·3 cites·14 claims
- 0434US2007173069A1Method of forming insulating layer of semiconductor deviceKIM JUN-SEUCK·Filed 2006·Application pending·0 cites
- 0533US2007077772A1Apparatus and method for manufacturing semiconductor device using plasmaKIM JUN-SEUCK·Filed 2006·Application pending·0 cites
- 0633US2006166513A1Method and apparatus for forming thin film of semiconductor deviceKIM JUN-SEUCK·Filed 2006·Application pending·0 cites
- 0732US2006105552A1Apparatus and method of activating impurity atom in manufacture of semiconductor deviceKIM JUN-SEUCK·Filed 2005·Application pending·0 cites
- 0832US2006154427A1Method of thermally treating a wafer and method of fabricating a semiconductor device using the sameKIM JUN-SEUCK·Filed 2005·Application pending·0 cites
- 0930US2007047303A1Electrically erasable programmable read-only memory cell transistor and related methodKIM JUN-SEUCK·Filed 2006·Application pending·0 cites
- 1017US2002037617A1Method for forming gate electrodes in a semicoductor device using formed fine patternsFiled 2001·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Jun-Seuck Kim files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →