Inventor · disambiguated record
Justus Kuhn
Also filed as: KUHN JUSTUS
19 granted patents·1 pending application·214 citations·filing 2001–2005
94Inventor score
Top patents by PatentIndex Score
20 records- 0183US6954871B2Method of matching different signal propagation times between a controller and at least two processing units, and a computer systemINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 11, 2005·39 cites·18 claims
- 0280US6556492B2System for testing fast synchronous semiconductor circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 29, 2003·31 cites·10 claims
- 0375US6744272B2Test circuitFiled 2002·Granted Jun 1, 2004·25 cites·11 claims
- 0474US6762611B2Test configuration and test method for testing a plurality of integrated circuits in parallelINFINEON TECHOLOGIES AG·Filed 2001·Granted Jul 13, 2004·18 cites·8 claims
- 0570US6515319B2Field-effect-controlled transistor and method for fabricating the transistorINFINEON TECHNOLOGIES AG·Filed 2001·Granted Feb 4, 2003·17 cites·6 claims
- 0665US6853206B2Method and probe card configuration for testing a plurality of integrated circuits in parallelINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 8, 2005·11 cites·6 claims
- 0764US6721904B2System for testing fast integrated digital circuits, in particular semiconductor memory modulesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 13, 2004·15 cites·29 claims
- 0861US6871306B2Method and device for reading and for checking the time position of data response signals read out from a memory module to be testedINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 22, 2005·12 cites·20 claims
- 0956US7307895B2Self test for the phase angle of the data read clock signal DQSINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 11, 2007·3 cites·27 claims
- 1055US7043653B2Method and apparatus for synchronous signal transmission between at least two logic or memory componentsINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 9, 2006·5 cites·15 claims
- 1153US7117404B2Test circuit for testing a synchronous memory circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 3, 2006·8 cites·6 claims
- 1253US6618305B2Test circuit for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 9, 2003·8 cites·9 claims
- 1350US6910161B2Device and method for reducing the number of addresses of faulty memory cellsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 21, 2005·7 cites·2 claims
- 1448US6865707B2Test data generatorINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 8, 2005·6 cites·20 claims
- 1545US7062690B2System for testing fast synchronous digital circuits, particularly semiconductor memory chipsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 13, 2006·3 cites·16 claims
- 1641US6862702B2Address counter for addressing synchronous high-frequency digital circuits, in particular memory devicesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 1, 2005·3 cites·10 claims
- 1741US6839397B2Circuit configuration for generating control signals for testing high-frequency synchronous digital circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jan 4, 2005·3 cites·11 claims
- 1834US7117403B2Method and device for generating digital signal patternsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Oct 3, 2006·0 cites·18 claims
- 1934US2003005389A1Test circuit for testing a synchronous circuitFiled 2002·Application pending·0 cites
- 2031US6957373B2Address generator for generating addresses for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 18, 2005·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →