Inventor · disambiguated record
June Lee
Also filed as: LEE JUNE · LEE JUNE-BAE
23 granted patents·77 citations·filing 2002–2018
94Inventor score
Top patents by PatentIndex Score
23 records- 0195US10002073B2Selective data recycling in non-volatile memorySK HYNIX INC·Filed 2016·Granted Jun 19, 2018·16 cites·21 claims
- 0294US9653176B2Read disturb reclaim policySK HYNIX MEMORY SOLUTIONS INC·Filed 2016·Granted May 16, 2017·12 cites·20 claims
- 0386US9502127B2System optimization in flash memoriesSK HYNIX MEMORY SOLUTIONS INC·Filed 2016·Granted Nov 22, 2016·7 cites·16 claims
- 0481US10535410B2Hybrid read disturb count managementSK HYNIX INC·Filed 2018·Granted Jan 14, 2020·2 cites·20 claims
- 0581US10347331B2Read threshold optimization in flash memoriesSK HYNIX INC·Filed 2017·Granted Jul 9, 2019·5 cites·25 claims
- 0681US10229740B2Memory system of 3D NAND flash and operating method thereofSK HYNIX INC·Filed 2017·Granted Mar 12, 2019·5 cites·18 claims
- 0781US10210041B2Systems and methods for low latency copy operations in non-volatile memorySK HYNIX INC·Filed 2016·Granted Feb 19, 2019·3 cites·19 claims
- 0880US10147500B2Hybrid read disturb count managementSK HYNIX INC·Filed 2016·Granted Dec 4, 2018·4 cites·17 claims
- 0980US9792999B2Adaptive scheme for incremental step pulse programming of flash memorySK HYNIX INC·Filed 2016·Granted Oct 17, 2017·5 cites·13 claims
- 1077US10326473B2Symbol-based coding for NAND flash devicesSK HYNIX INC·Filed 2017·Granted Jun 18, 2019·2 cites·20 claims
- 1173US9979417B2Enhanced chip-kill schemes by using ECC syndrome patternSK HYNIX INC·Filed 2016·Granted May 22, 2018·3 cites·12 claims
- 1270US10169141B2Modifiable stripe length in flash memory devicesSK HYNIX INC·Filed 2017·Granted Jan 1, 2019·1 cites·20 claims
- 1369US9996412B2Enhanced chip-kill schemes by using sub-trunk CRCSK HYNIX INC·Filed 2016·Granted Jun 12, 2018·2 cites·18 claims
- 1469US9733861B2Data temperature profiling by smart counterSK HYNIX MEMORY SOLUTIONS INC·Filed 2016·Granted Aug 15, 2017·1 cites·18 claims
- 1567US10120585B2Memory system of optimal read reference voltage and operating method thereofSK HYNIX INC·Filed 2017·Granted Nov 6, 2018·2 cites·13 claims
- 1656US10074439B2Modeling method of threshold voltage distributionsSK HYNIX INC·Filed 2016·Granted Sep 11, 2018·1 cites·14 claims
- 1755US9607710B2Read-threshold calibration in a solid state storage systemSK HYNIX MEMORY SOLUTIONS INC·Filed 2015·Granted Mar 28, 2017·1 cites·15 claims
- 1850US9952775B2Unusable column mapping in flash memory devicesSK HYNIX INC·Filed 2017·Granted Apr 24, 2018·0 cites·20 claims
- 1949US10157097B2Redundant bytes utilization in error correction codeSK HYNIX INC·Filed 2017·Granted Dec 18, 2018·0 cites·20 claims
- 2048US10148293B2Incremental LLR generation for flash memoriesSK HYNIX INC·Filed 2016·Granted Dec 4, 2018·0 cites·16 claims
- 2146US6842373B2Command decoder and decoding method for use in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jan 11, 2005·5 cites·31 claims
- 2240US10108472B2Adaptive read disturb reclaim policySK HYNIX INC·Filed 2016·Granted Oct 23, 2018·0 cites·15 claims
- 2336US9953722B2Methods of system optimization by over-sampling readSK HYNIX INC·Filed 2016·Granted Apr 24, 2018·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →