Inventor · disambiguated record
Jürgen Lindolf
Also filed as: LINDOLF JUERGEN · LINDOLF JURGEN
21 granted patents·2 pending applications·263 citations·filing 1999–2006
95Inventor score
Top patents by PatentIndex Score
23 records- 0184US6717200B1Vertical field effect transistor with internal annular gate and method of productionSIEMENS AG·Filed 1999·Granted Apr 6, 2004·75 cites·6 claims
- 0272US6756655B2Fuse for a semiconductor configuration and method for its productionINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 29, 2004·19 cites·7 claims
- 0372US6501283B2Circuit configuration for measuring the capacitance of structures in an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2001·Granted Dec 31, 2002·23 cites·7 claims
- 0469US6458631B1Method for fabricating an integrated circuit, in particular an antifuseINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 1, 2002·17 cites·6 claims
- 0568US7317603B2Integrated circuit with electrostatic discharge protectionINFINEON TECHNOLOGIES AG·Filed 2006·Granted Jan 8, 2008·4 cites·12 claims
- 0666US6445630B2Method for carrying out a burn-in process for electrically stressing a semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted Sep 3, 2002·19 cites·7 claims
- 0764US6429503B2Connection element in an integrated circuit having a layer structure disposed between two conductive structuresINFINEON TECHNOLOGIES AG·Filed 2001·Granted Aug 6, 2002·13 cites·8 claims
- 0862US6768139B2Transistor configuration for a bandgap circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jul 27, 2004·10 cites·6 claims
- 0959US6600680B2Circuit configuration and method for determining a time constant of a storage capacitor of a memory cell in a semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jul 29, 2003·8 cites·10 claims
- 1059US6456553B1Circuit configuration for switching over a receiver circuit in particular in DRAM memories and DRAM memory having the circuit configurationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Sep 24, 2002·11 cites·8 claims
- 1158US7126204B2Integrated semiconductor circuit with an electrically programmable switching elementINFINEON TECHNOLOGIES AG·Filed 2004·Granted Oct 24, 2006·9 cites·20 claims
- 1258US6838724B2Transistor array and semiconductor memory configuration fabricated with the transistor arrayINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 4, 2005·9 cites·12 claims
- 1356US6721215B2Integrated dynamic memory and method for operating itINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 13, 2004·9 cites·32 claims
- 1456US6552549B1Method of reading electrical fuses/antifusesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 22, 2003·9 cites·4 claims
- 1548US6917208B2Method and test structure for determining resistances at a plurality of interconnected resistors in an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 12, 2005·6 cites·4 claims
- 1648US6417722B1Sense amplifier configuration having a field-effect transistor having a short channel length and an adjustable threshold voltageINFINEON TECHNOLOGIES AG·Filed 2000·Granted Jul 9, 2002·3 cites·9 claims
- 1744US6125073AIntegrated semiconductor memorySIEMENS AG·Filed 1999·Granted Sep 26, 2000·9 cites·9 claims
- 1842US6181624B1Integrated circuit memory having a sense amplifier activated based on word line potentialsSIEMENS AG·Filed 1999·Granted Jan 30, 2001·8 cites·4 claims
- 1938US6919234B2Method for producing an antifuse in a substrate and an antifuse structure for integration in a substrateINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 19, 2005·0 cites·23 claims
- 2038US6449206B2Semiconductor circuit configurationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Sep 10, 2002·2 cites·15 claims
- 2137US2005023637A1Method for producing an antifuse structure and antifuseFiled 2003·Application pending·0 cites
- 2236US6788129B2Integrated circuit having a programmable element and method of operating the circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 7, 2004·0 cites·6 claims
- 2335US2005099745A1ESD protection apparatusFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →