Inventor · disambiguated record
Jun Liu
Also filed as: LIU JUN · LIU JUN XIU
54 granted patents·10 pending applications·149 citations·filing 2001–2025
97Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD31LAUNCH TECH CO LTD20TAIWAN SEMICONDUCTOR MFG7LIU JUN3LIU JING1
Top patents by PatentIndex Score
64 records- 0195US11764094B2Semiconductor processing tool and methods of operationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 19, 2023·2 cites·20 claims
- 0293US12062166B2Method and system for diagnosing a semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 13, 2024·1 cites·20 claims
- 0393US11816411B2Method and system for semiconductor wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Nov 14, 2023·5 cites·20 claims
- 0491US10504737B2Methods of enhancing surface topography on a substrate for inspectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 10, 2019·5 cites·20 claims
- 0590US7205630B2Method and apparatus for a semiconductor device having low and high voltage transistorsTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Apr 17, 2007·27 cites·21 claims
- 0689US10825650B2Machine learning on wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Nov 3, 2020·6 cites·20 claims
- 0788US12119273B2System and method for high speed inspection of semiconductor substratesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Oct 15, 2024·1 cites·20 claims
- 0884US8103462B2Oil consumption monitoring for aircraft engineLIU JUN·Filed 2007·Granted Jan 24, 2012·17 cites·20 claims
- 0983US11749571B2System and method for high speed inspection of semiconductor substratesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 5, 2023·1 cites·20 claims
- 1083US9996988B2Intelligent tire pressure monitoring system and methodLAUNCH TECH CO LTD·Filed 2015·Granted Jun 12, 2018·2 cites·8 claims
- 1183US2025096022A1Nozzle having real time inspection functionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1282US7301185B2High-voltage transistor device having an interlayer dielectric etch stop layer for preventing leakage and improving breakdown voltageTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Nov 27, 2007·34 cites·11 claims
- 1381US12087611B2Semiconductor processing tool and methods of operationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 10, 2024·0 cites·20 claims
- 1480US11475721B2Method for performing vehicle remote diagnosis and related devicesLAUNCH TECH CO LTD·Filed 2019·Granted Oct 18, 2022·3 cites·16 claims
- 1580US8712729B2Anomalous data detection methodLIU JUN·Filed 2009·Granted Apr 29, 2014·9 cites·17 claims
- 1678US10784114B2Methods of enhancing surface topography on a substrate for inspectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Sep 22, 2020·1 cites·20 claims
- 1778US2024379401A1Semiconductor processing tool and methods of operationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1877US12191175B2Nozzle having real time inspection functionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jan 7, 2025·0 cites·20 claims
- 1976US11935722B2Machine learning on wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Mar 19, 2024·0 cites·20 claims
- 2075US12190036B2Method and system for semiconductor wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 7, 2025·0 cites·20 claims
- 2175US10748354B2Communication method, device, and system for vehicle remote diagnosisLAUNCH TECH CO LTD·Filed 2018·Granted Aug 18, 2020·3 cites·15 claims
- 2274US2024379463A1Systems for inspection of semiconductor substratesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2372US11475448B2Maintenance plant management method, system and data management serverLAUNCH TECH CO LTD·Filed 2018·Granted Oct 18, 2022·1 cites·10 claims
- 2472US7253114B2Self-aligned method for defining a semiconductor gate oxide in high voltage device areaTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Aug 7, 2007·6 cites·20 claims
- 2572US2025249548A1Chemical mechanical polishing apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 2672US2024387212A1Apparatus and methods for determining fluid dynamics of liquid film on wafer surfaceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2771US11222788B2Methods of enhancing surface topography on a substrate for inspectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jan 11, 2022·0 cites·20 claims
- 2870US11449984B2Method and system for diagnosing a semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Sep 20, 2022·0 cites·20 claims
- 2970US11424101B2Machine learning on wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 23, 2022·0 cites·20 claims
- 3070US7196392B2Semiconductor structure for isolating integrated circuits of various operation voltagesTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Mar 27, 2007·5 cites·18 claims
- 3169US11017522B2Inspection and cleaning system and method for the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted May 25, 2021·1 cites·20 claims
- 3268US11514731B2Method and system for remote vehicle diagnosticsLAUNCH TECH CO LTD·Filed 2019·Granted Nov 29, 2022·1 cites·15 claims
- 3368US11146664B2Method for remote vehicle diagnostics and deviceLAUNCH TECH CO LTD·Filed 2019·Granted Oct 12, 2021·1 cites·16 claims
- 3468US10504758B2Nozzle having real time inspection functionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Dec 10, 2019·1 cites·18 claims
- 3567US2023384211A1In-situ apparatus for detecting abnormality in process tubeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 3665US11355370B2Nozzle having real time inspection functionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 7, 2022·0 cites·7 claims
- 3765US9454901B2Method and device for monitoring real-time road conditionLAUNCH TECH CO LTD·Filed 2015·Granted Sep 27, 2016·2 cites·10 claims
- 3864US9776639B2Method, and apparatus, and system for generating driving behavior guiding informationLAUNCH TECH CO LTD·Filed 2015·Granted Oct 3, 2017·2 cites·5 claims
- 3964US7498653B2Semiconductor structure for isolating integrated circuits of various operating voltagesTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Mar 3, 2009·3 cites·18 claims
- 4061US12326397B2In-situ apparatus for detecting abnormality in process tubeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 10, 2025·0 cites·20 claims
- 4161US12296428B2Chemical mechanical polishing apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted May 13, 2025·0 cites·20 claims
- 4261US12272576B2Apparatus and methods for determining fluid dynamics of liquid film on wafer surfaceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Apr 8, 2025·0 cites·20 claims
- 4361US10755405B2Method and system for diagnosing a semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Aug 25, 2020·0 cites·20 claims
- 4460US10163339B2Monitoring traffic congestionSAP SE·Filed 2016·Granted Dec 25, 2018·1 cites·20 claims
- 4554US11107671B2Method of processing semiconductor substrateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 31, 2021·0 cites·20 claims
- 4654US7436043B2N-well and N+ buried layer isolation by auto doping to reduce chip sizeTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Oct 14, 2008·7 cites·11 claims
- 4751US11449837B2Maintenance equipment management method, system and data management serverLAUNCH TECH CO LTD·Filed 2018·Granted Sep 20, 2022·0 cites·10 claims
- 4851US9715767B2Method and apparatus for processing realtime vehicle operating dataLAUNCH TECH CO LTD·Filed 2015·Granted Jul 25, 2017·1 cites·14 claims
- 4949US12057965B2Data communication method and apparatus, electronic device, and storage mediumLAUNCH TECH CO LTD·Filed 2022·Granted Aug 6, 2024·0 cites·18 claims
- 5045US12077182B2Longitudinal and lateral integrated moving horizon decision making method and apparatus for autonomous vehicle in snowy and icy environment based on trajectory predictionUNIV JILIN·Filed 2021·Granted Sep 3, 2024·0 cites·10 claims
Showing the top 50 of 64 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →