Inventor · disambiguated record
Ju Seok Maeng
Also filed as: MAENG JU-SEOK
4 granted patents·215 citations·filing 1998–2001
81Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0192US6563331B1Test and burn-in apparatus, in-line system using the test and burn-in apparatus, and test method using the in-line systemSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted May 13, 2003·88 cites·26 claims
- 0289US6313652B1Test and burn-in apparatus, in-line system using the test and burn-in apparatus, and test method using the in-line systemSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Nov 6, 2001·85 cites·10 claims
- 0380US6287878B1Method of fabricating chip scale packageSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Sep 11, 2001·38 cites·18 claims
- 0451US6618642B2Method, program storage device, and apparatus for optimizing and analyzing efficiency of equipmentSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Sep 9, 2003·4 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →