Inventor · disambiguated record
Jun Ohno
Also filed as: OHNO JUN · OHNO JUN-ICHI
24 granted patents·6 pending applications·219 citations·filing 1985–2023
95Inventor score
Files withFUJITSU LTD6ASAHI CHEMICAL IND5FUJITSU MICROELECTRONICS LTD4HITACHI GLOBAL STORAGE TECH3TOSHIBA KK3
Top patents by PatentIndex Score
30 records- 0195US7394607B2Disk drive with position detectionHITACHI GLOBAL STORAGE TECH·Filed 2006·Granted Jul 1, 2008·24 cites·20 claims
- 0288US8111575B2Semiconductor deviceMORI KAORU·Filed 2010·Granted Feb 7, 2012·14 cites·20 claims
- 0383US6842391B2Semiconductor memory of a dynamic random access memory (DRAM) type having a static random access memory (SRAM) interfaceFUJITSU LTD·Filed 2003·Granted Jan 11, 2005·28 cites·6 claims
- 0475US11643741B2Method of producing hydrogenASAHI CHEMICAL IND·Filed 2019·Granted May 9, 2023·1 cites·12 claims
- 0575US7675773B2Semiconductor memory, test method of semiconductor memory and systemFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Mar 9, 2010·9 cites·19 claims
- 0674US6798276B2Reduced potential generation circuit operable at low power-supply potentialFUJITSU LTD·Filed 2002·Granted Sep 28, 2004·23 cites·2 claims
- 0772US5478475AFluid distribution apparatus, an artificial moving bed, and a continuous adsorption methodTSUKISHIMA KIKAI CO·Filed 1993·Granted Dec 26, 1995·36 cites·15 claims
- 0870US8089720B2Hard-disk driveURAKAMI YOSUKE·Filed 2009·Granted Jan 3, 2012·2 cites·3 claims
- 0968US9224645B2Silicon carbide semiconductor device and method for manufacturing the sameOHNO JUN-ICHI·Filed 2011·Granted Dec 29, 2015·2 cites·15 claims
- 1067US7688659B2Semiconductor memory capable of testing a failure before programming a fuse circuit and method thereofFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Mar 30, 2010·6 cites·17 claims
- 1163US12421613B2Electrolysis system and method of use of the sameASAHI CHEMICAL IND·Filed 2021·Granted Sep 23, 2025·0 cites·13 claims
- 1262US7730232B2Data transfer method and systemFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Jun 1, 2010·2 cites·12 claims
- 1360US2024003028A1Alkaline water electrolysis system and method of operating alkaline water electrolysis systemASAHI CHEMICAL IND·Filed 2021·Application pending·0 cites
- 1456US7114025B2Semiconductor memory having test function for refresh operationFUJITSU LTD·Filed 2003·Granted Sep 26, 2006·9 cites·10 claims
- 1556US4783424AMethod of making a semiconductor device involving simultaneous connection and disconnectionTOKYO SHIBAURA ELECTRIC CO·Filed 1986·Granted Nov 8, 1988·19 cites·2 claims
- 1656US2022316081A1Method of operating electrolysis apparatusASAHI CHEMICAL IND·Filed 2020·Application pending·0 cites
- 1752US2025223716A1Information processing device, electrolysis device, plan creation method, and programASAHI CHEMICAL IND·Filed 2023·Application pending·0 cites
- 1851US7672181B2Semiconductor memory, test method of semiconductor memory and systemFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Mar 2, 2010·2 cites·13 claims
- 1946US9005462B2Method for manufacturing silicon carbide semiconductor deviceOHNO JUN-ICHI·Filed 2011·Granted Apr 14, 2015·0 cites·5 claims
- 2045US5093282AMethod of making a semiconductor device having lead pins and a metal shellTOSHIBA KK·Filed 1991·Granted Mar 3, 1992·20 cites·3 claims
- 2145US2006119965A1Information recording device using patterned medium and control method thereofHITACHI GLOBAL STORAGE TECH·Filed 2005·Application pending·0 cites
- 2243US4949160ASemiconductor deviceTOSHIBA KK·Filed 1988·Granted Aug 14, 1990·11 cites·4 claims
- 2343US2003026041A1Recording and reproducing separation type magnetic head having thin part in upper core or magnetic film and magnetic storage apparatus using the sameHITACHI LTD·Filed 2002·Application pending·0 cites
- 2443US2008204924A1Information recording deviceOHNO JUN·Filed 2008·Application pending·0 cites
- 2542US7362652B2Semiconductor circuitFUJITSU LTD·Filed 2006·Granted Apr 22, 2008·0 cites·14 claims
- 2638US4608668ASemiconductor deviceTOKYO SHIBAURA ELECTRIC CO·Filed 1985·Granted Aug 26, 1986·7 cites·14 claims
- 2736US7120086B2Semiconductor circuitFUJITSU LTD·Filed 2004·Granted Oct 10, 2006·0 cites·19 claims
- 2836US7057959B2Semiconductor memory having mode register access in burst modeFUJITSU LTD·Filed 2004·Granted Jun 6, 2006·0 cites·2 claims
- 2933US5528077AFlexible tab semiconductor deviceTOSHIBA KK·Filed 1995·Granted Jun 18, 1996·4 cites·3 claims
- 3031US6700737B1Recording and reproducing separation type magnetic head having thin part in upper core or magnetic film and magnetic storage apparatus using the sameHITACHI GLOBAL STORAGE TECH·Filed 1999·Granted Mar 2, 2004·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →