Inventor · disambiguated record
Jun Bum Park
Also filed as: PARK JUN-BUM
13 granted patents·1 pending application·6 citations·filing 2010–2023
83Inventor score
Files withSAMSUNG ELECTRONICS CO LTD9PARK JUN BUM2DERMA CENTRIC INC1HYUNDAI MOTOR CO LTD1WRT LAB CO LTD1
Top patents by PatentIndex Score
14 records- 0177US11163652B2Storage device capable of performing peer-to-peer communication and data storage system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Nov 2, 2021·1 cites·16 claims
- 0274US9804790B2Method of operating memory controller and semiconductor storage device including memory controllerSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Oct 31, 2017·2 cites·18 claims
- 0370US10725871B2Storage device capable of performing peer-to-peer communication and data storage system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jul 28, 2020·1 cites·8 claims
- 0462US8780487B2Method of tuning skew between read head and write head and storage device thereofPARK JUN BUM·Filed 2012·Granted Jul 15, 2014·2 cites·20 claims
- 0559US12393333B2Storage device reorganizing data and related operating methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Aug 19, 2025·0 cites·20 claims
- 0651US11147769B2Composition for preventing hair loss and thickening hair and preparation method thereofDERMA CENTRIC INC·Filed 2020·Granted Oct 19, 2021·0 cites·9 claims
- 0746US11080519B2Method and apparatus for gesture recognitionWRT LAB CO LTD·Filed 2018·Granted Aug 3, 2021·0 cites·12 claims
- 0842US10474243B2Vehicle system for recognizing a driver's intention, and control method of the sameHYUNDAI MOTOR CO LTD·Filed 2017·Granted Nov 12, 2019·0 cites·20 claims
- 0940US10473579B2Apparatus for inspecting material property of plurality of measurement objectsSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 12, 2019·0 cites·14 claims
- 1039US10733719B2Wafer inspection apparatus and wafer inspection method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Aug 4, 2020·0 cites·3 claims
- 1138US8468321B2Method relocating code objects and disc drive using samePARK JUN-BUM·Filed 2010·Granted Jun 18, 2013·0 cites·13 claims
- 1236US10431505B2Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surfaceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 1, 2019·0 cites·11 claims
- 1335US10338370B2Clock signal generators and substrate inspecting apparatuses having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jul 2, 2019·0 cites·18 claims
- 1434US2018144995A1Optical inspection apparatus and method and method of fabricating semiconductor device using the apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →