Inventor · disambiguated record
Junhee Park
Also filed as: PARK JUNHEE
11 granted patents·1 pending application·75 citations·filing 2015–2023
87Inventor score
Files withFUJITSU LTD8GENESYSTEM CO LTD1PUSAN NAT UNIV INDUSTRY-UNIV COOP FOUND1SAMSUNG ELECTRONICS CO LTD1UNIV CALIFORNIA1
Top patents by PatentIndex Score
12 records- 0197US10133650B1Automated API parameter resolution and validationFUJITSU LTD·Filed 2017·Granted Nov 20, 2018·43 cites·20 claims
- 0291US11163621B1Automated API access using machine learningFUJITSU LTD·Filed 2020·Granted Nov 2, 2021·3 cites·20 claims
- 0389US10572370B2Test-assisted application programming interface (API) learningFUJITSU LTD·Filed 2017·Granted Feb 25, 2020·7 cites·20 claims
- 0488US11409642B2Automatic parameter value resolution for API evaluationFUJITSU LTD·Filed 2020·Granted Aug 9, 2022·4 cites·19 claims
- 0588US10693795B2Providing access to application program interfaces and Internet of Thing devicesFUJITSU LTD·Filed 2018·Granted Jun 23, 2020·7 cites·20 claims
- 0687US10656973B2Automated API evaluation based on API parameter resolutionFUJITSU LTD·Filed 2018·Granted May 19, 2020·5 cites·20 claims
- 0784US10997258B2Bot networksFUJITSU LTD·Filed 2018·Granted May 4, 2021·4 cites·17 claims
- 0879US10942376B2System and method for using exceptional points in plasmonic nanostructures for sensing, communication and imagingUNIV CALIFORNIA·Filed 2017·Granted Mar 9, 2021·2 cites·21 claims
- 0956US11468180B2Data privacy protection on cloud-based optimization systemsFUJITSU LTD·Filed 2020·Granted Oct 11, 2022·0 cites·20 claims
- 1054US2024179893A1Semiconductor apparatus having multi-layered bit line contact and manufacturing method of the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1147US12472503B2Modular type multi-plex PCR apparatusGENESYSTEM CO LTD·Filed 2022·Granted Nov 18, 2025·0 cites·5 claims
- 1244US9581869B2In-plane switching mode liquid crystal display device and fabrication method thereofPUSAN NAT UNIV INDUSTRY-UNIV COOP FOUND·Filed 2015·Granted Feb 28, 2017·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →