Inventor · disambiguated record
Junbum Park
Also filed as: PARK JUNBUM
17 granted patents·4 pending applications·24 citations·filing 2012–2023
88Inventor score
Top patents by PatentIndex Score
21 records- 0188US9547789B2Mobile terminal and method for controlling the sameLG ELECTRONICS INC·Filed 2015·Granted Jan 17, 2017·14 cites·16 claims
- 0287US11755241B2Storage system and method for operating storage system based on buffer utilizationSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Sep 12, 2023·2 cites·18 claims
- 0386US10459854B2Storage device including a snooper that monitors a system bus to detect completion of writing data to a buffer memory and a method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 29, 2019·5 cites·20 claims
- 0480US12165933B2Semiconductor substrate processing apparatus and semiconductor substrate measuring apparatus using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Dec 10, 2024·1 cites·20 claims
- 0572US11016912B2Storage device or memory controller with first direct memory access engine configured to control writing first data into buffer memory and second direct memory access engine configured to control transmitting written first data to external host deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted May 25, 2021·1 cites·20 claims
- 0668US12162504B2Device provided to vehicle and control method thereforLG ELECTRONICS INC·Filed 2018·Granted Dec 10, 2024·1 cites·14 claims
- 0762US12474393B2Terahertz probeSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 18, 2025·0 cites·17 claims
- 0862US12469750B2Method of extracting properties of a layer on a waferSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 11, 2025·0 cites·20 claims
- 0961US11680898B2Hybrid probe, physical property analysis apparatus including the same, and method of measuring semiconductor device using the apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jun 20, 2023·0 cites·17 claims
- 1055US11946881B2Inspection apparatus and inspection method using sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Apr 2, 2024·0 cites·20 claims
- 1155US11579168B2Probe for detecting near field and near-field detecting system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 14, 2023·0 cites·20 claims
- 1255US11579167B2Probe for detecting near field and near-field detection system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 14, 2023·0 cites·20 claims
- 1354US2024218561A1Thin-film deposition apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1453US12194924B2Device provided in vehicle and method for controlling sameLG ELECTRONICS INC·Filed 2019·Granted Jan 14, 2025·0 cites·14 claims
- 1553US10871396B2Optical emission spectroscopy calibration device and system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Dec 22, 2020·0 cites·20 claims
- 1652US2024019362A1Probe and inspection apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1746US11900004B2Vehicle apparatus and control methodLG ELECTRONICS INC·Filed 2018·Granted Feb 13, 2024·0 cites·14 claims
- 1846US11488875B2Semiconductor substrate measuring apparatus and plasma treatment apparatus using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Nov 1, 2022·0 cites·19 claims
- 1939US2015262343A1Image processing device and image processing methodLG ELECTRONICS INC·Filed 2012·Application pending·0 cites
- 2039US2018113615A1Storage device generating adaptive interrupt and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2017·Application pending·0 cites
- 2135US9487172B2Image display device and method thereofSHIN JEONGEUN·Filed 2012·Granted Nov 8, 2016·0 cites·33 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →