Inventor · disambiguated record
Junichi Wada
Also filed as: WADA JUNICHI
72 granted patents·20 pending applications·1,228 citations·filing 1993–2021
99Inventor score
Top patents by PatentIndex Score
92 records- 0196US9362487B2Ferroelectric memory and manufacturing method of the sameTOSHIBA KK·Filed 2013·Granted Jun 7, 2016·32 cites·3 claims
- 0294US10600116B2Reservation management device, reservation management system, and reservation management methodOMRON TATEISI ELECTRONICS CO·Filed 2016·Granted Mar 24, 2020·12 cites·13 claims
- 0394US6423192B1Sputtering apparatus and film forming methodTOSHIBA KK·Filed 2000·Granted Jul 23, 2002·91 cites·20 claims
- 0493US8410467B2Nonvolatile memory device and method of manufacturing the sameWADA JUNICHI·Filed 2010·Granted Apr 2, 2013·20 cites·9 claims
- 0593US6071810AMethod of filling contact holes and wiring grooves of a semiconductor deviceTOSHIBA KK·Filed 1997·Granted Jun 6, 2000·101 cites·2 claims
- 0692US10650444B2Battery reservation device and battery reservation methodOMRON TATEISI ELECTRONICS CO·Filed 2016·Granted May 12, 2020·11 cites·10 claims
- 0792US9754793B2Method for manufacturing semiconductor deviceTOSHIBA MEMORY CORP·Filed 2016·Granted Sep 5, 2017·8 cites·20 claims
- 0892US7351656B2Semiconductor device having oxidized metal film and manufacture method of the sameKABUSHIKI KAIHSA TOSHIBA·Filed 2006·Granted Apr 1, 2008·20 cites·19 claims
- 0992US6673704B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2002·Granted Jan 6, 2004·42 cites·26 claims
- 1092US5775980APolishing method and polishing apparatusTOSHIBA KK·Filed 1996·Granted Jul 7, 1998·105 cites·8 claims
- 1191US10643272B2Battery reservation deviceOMRON TATEISI ELECTRONICS CO·Filed 2016·Granted May 5, 2020·7 cites·7 claims
- 1291US6306756B1Method for production of semiconductor deviceTOSHIBA KK·Filed 2000·Granted Oct 23, 2001·62 cites·10 claims
- 1391US5607718APolishing method and polishing apparatusTOSHIBA KK·Filed 1994·Granted Mar 4, 1997·119 cites·29 claims
- 1489US6229211B1Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 1999·Granted May 8, 2001·88 cites·19 claims
- 1588US9673217B1Semiconductor device and method for manufacturing sameTOSHIBA KK·Filed 2016·Granted Jun 6, 2017·6 cites·6 claims
- 1688US9385510B2Spark plug for internal combustion engine and method of manufacturing spark plugDENSO CORP·Filed 2015·Granted Jul 5, 2016·3 cites·16 claims
- 1787US8922018B2Semiconductor device and semiconductor device manufacturing methodISHIZAKI TAKESHI·Filed 2012·Granted Dec 30, 2014·13 cites·9 claims
- 1887US8569728B2Nonvolatile memory with variable resistance change layersTAKANO KENSUKE·Filed 2010·Granted Oct 29, 2013·10 cites·16 claims
- 1986US9780111B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2015·Granted Oct 3, 2017·5 cites·13 claims
- 2086US7996813B2Method for generating pattern, method for manufacturing semiconductor device, semiconductor device, and computer programTOSHIBA KK·Filed 2010·Granted Aug 9, 2011·9 cites·16 claims
- 2186US5409862AMethod for making aluminum single crystal interconnections on insulatorsTOSHIBA KK·Filed 1993·Granted Apr 25, 1995·56 cites·15 claims
- 2285US6090701AMethod for production of semiconductor deviceTOSHIBA KK·Filed 1995·Granted Jul 18, 2000·74 cites·11 claims
- 2384US11010824B2Battery reservation device and battery reservation methodOMRON TATEISI ELECTRONICS CO·Filed 2016·Granted May 18, 2021·4 cites·8 claims
- 2484US7994054B2Semiconductor device having oxidized metal film and manufacture method of the sameTOSHIBA KK·Filed 2007·Granted Aug 9, 2011·6 cites·20 claims
- 2582US10082125B2Control apparatus and ignition apparatusDENSO CORP·Filed 2015·Granted Sep 25, 2018·3 cites·22 claims
- 2682US7923839B2Semiconductor device and method for fabricating semiconductor deviceTOSHIBA KK·Filed 2009·Granted Apr 12, 2011·7 cites·20 claims
- 2782US5723367AWiring forming methodTOSHIBA KK·Filed 1996·Granted Mar 3, 1998·77 cites·6 claims
- 2880US7791202B2Semiconductor device having oxidized metal film and manufacture method of the sameTOSHIBA KK·Filed 2008·Granted Sep 7, 2010·4 cites·20 claims
- 2979US9153779B2Resistance change memory element and resistance change memoryTOSHIBA KK·Filed 2013·Granted Oct 6, 2015·6 cites·16 claims
- 3079US8148274B2Semiconductor device having oxidized metal film and manufacture method of the sameWADA JUNICHI·Filed 2008·Granted Apr 3, 2012·4 cites·12 claims
- 3179US5661345ASemiconductor device having a single-crystal metal wiringTOSHIBA KK·Filed 1994·Granted Aug 26, 1997·35 cites·3 claims
- 3278US6518177B1Method of manufacturing a semiconductor deviceTOSHIBA KK·Filed 2001·Granted Feb 11, 2003·23 cites·7 claims
- 3377US10946750B2Charge/discharge control device, charge/discharge control system, and charge/discharge control methodOMRON TATEISI ELECTRONICS CO·Filed 2016·Granted Mar 16, 2021·3 cites·15 claims
- 3477US10661676B2Guide device, guide system, and guide methodOMRON TATEISI ELECTRONICS CO·Filed 2016·Granted May 26, 2020·3 cites·11 claims
- 3577US6500686B2Hot plate and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2001·Granted Dec 31, 2002·20 cites·22 claims
- 3676US10518640B2Battery remaining capacity display device, battery system, and battery remaining capacity display methodOMRON TATEISI ELECTRONICS CO·Filed 2016·Granted Dec 31, 2019·3 cites·6 claims
- 3775US9905462B2Semiconductor device and method for manufacturing the sameTOSHIBA MEMORY CORP·Filed 2015·Granted Feb 27, 2018·2 cites·6 claims
- 3874US8537594B2Resistance change element and resistance change memoryWADA JUNICHI·Filed 2011·Granted Sep 17, 2013·5 cites·20 claims
- 3974US6946387B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2003·Granted Sep 20, 2005·11 cites·2 claims
- 4072US10661857B2Drive mode selection device and drive mode selection methodOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted May 26, 2020·2 cites·13 claims
- 4171US10763122B2Method of manufacturing semiconductor device and etching maskTOSHIBA MEMORY CORP·Filed 2017·Granted Sep 1, 2020·1 cites·16 claims
- 4270US10298880B2Communication management system, communication system, communication management method, and mediumOKUYAMA TARO·Filed 2016·Granted May 21, 2019·2 cites·9 claims
- 4369US11003150B2Simulation method, recording medium wherein simulation program is stored, simulation device, and systemOMRON TATEISI ELECTRONICS CO·Filed 2014·Granted May 11, 2021·3 cites·15 claims
- 4469US10012203B2Ignition coil for internal combustion engineDENSO CORP·Filed 2015·Granted Jul 3, 2018·1 cites·5 claims
- 4569US7667332B2Method for generating pattern, method for manufacturing semiconductor device, semiconductor device, and computer program productTOSHIBA KK·Filed 2005·Granted Feb 23, 2010·4 cites·10 claims
- 4667US7595714B2Ignition coilDENSO CORP·Filed 2008·Granted Sep 29, 2009·3 cites·16 claims
- 4765US9779978B2Method of manufacturing semiconductor device and semiconductor manufacturing apparatusTOSHIBA KK·Filed 2015·Granted Oct 3, 2017·1 cites·16 claims
- 4863US9006697B2Resistance change element and nonvolatile memory deviceTOSHIBA KK·Filed 2013·Granted Apr 14, 2015·1 cites·19 claims
- 4962US6720253B2Method of manufacturing semiconductor device having an aluminum wiring layerTOSHIBA KK·Filed 2001·Granted Apr 13, 2004·9 cites·13 claims
- 5061US10501051B2Control device, control method, program, and control systemOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Dec 10, 2019·1 cites·13 claims
Showing the top 50 of 92 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →