Inventor · disambiguated record
Jung Taek You
Also filed as: YOU JUNG TAEK
21 granted patents·3 pending applications·45 citations·filing 2008–2024
92Inventor score
Top patents by PatentIndex Score
24 records- 0190US9418762B1Semiconductor memory deviceSK HYNIX INC·Filed 2015·Granted Aug 16, 2016·14 cites·27 claims
- 0288US12224747B2Semiconductor device related to calibrating termination resistanceSK HYNIX INC·Filed 2023·Granted Feb 11, 2025·2 cites·26 claims
- 0386US12198784B2Semiconductor device related to calibrating a termination resistanceSK HYNIX INC·Filed 2023·Granted Jan 14, 2025·1 cites·20 claims
- 0481US9514849B2Semiconductor memory device including controller and fuse circuits for performing repair operationSK HYNIX INC·Filed 2015·Granted Dec 6, 2016·7 cites·18 claims
- 0579US8751885B2Repair control circuit and semiconductor integrated circuit using the sameYOU JUNG TAEK·Filed 2012·Granted Jun 10, 2014·8 cites·19 claims
- 0667US10403387B2Repair circuit used in a memory device for performing error correction code operation and redundancy repair operationSK HYNIX INC·Filed 2017·Granted Sep 3, 2019·1 cites·19 claims
- 0766US12512181B2Memory device performing target refresh operation and operating method thereofSK HYNIX INC·Filed 2023·Granted Dec 30, 2025·0 cites·15 claims
- 0865US9362008B2Memory device using soft and hard repair operations and memory system including the sameSK HYNIX INC·Filed 2014·Granted Jun 7, 2016·3 cites·14 claims
- 0962US9324460B1Repair circuit, semiconductor memory device and method of operating the sameSK HYNIX INC·Filed 2015·Granted Apr 26, 2016·2 cites·19 claims
- 1057US8610491B2Anti-fuse control circuitYOU JUNG TAEK·Filed 2012·Granted Dec 17, 2013·2 cites·11 claims
- 1156US2025157522A1Semiconductor devices related to the generation of a commandSK HYNIX INC·Filed 2024·Application pending·0 cites
- 1254US2025378015A1Memory and memory controller supporting command address half rate modeSK HYNIX INC·Filed 2024·Application pending·0 cites
- 1353US9401218B2Fuse circuit and semiconductor apparatus including the sameSK HYNIX INC·Filed 2014·Granted Jul 26, 2016·1 cites·20 claims
- 1452US12322470B2Semiconductor devices and semiconductor systems calibrating termination resistanceSK HYNIX INC·Filed 2023·Granted Jun 3, 2025·0 cites·21 claims
- 1552US9552868B2Semiconductor memory device having various column repair modesSK HYNIX INC·Filed 2015·Granted Jan 24, 2017·1 cites·19 claims
- 1648US8867285B2Semiconductor apparatus and data write circuit of semiconductor apparatus for preventing transmission errorYOU JUNG TAEK·Filed 2011·Granted Oct 21, 2014·1 cites·12 claims
- 1748US8570094B2Semiconductor integrated circuit and method for driving the sameKIM YEON-UK·Filed 2011·Granted Oct 29, 2013·1 cites·16 claims
- 1844US10115478B2Semiconductor memory deviceSK HYNIX INC·Filed 2016·Granted Oct 30, 2018·0 cites·20 claims
- 1943US9583214B2Semiconductor circuit and leakage current test systemSK HYNIX INC·Filed 2013·Granted Feb 28, 2017·1 cites·8 claims
- 2039US10535418B2Memory device including repair circuit and operation method thereofSK HYNIX INC·Filed 2017·Granted Jan 14, 2020·0 cites·20 claims
- 2137US9287010B1Repair system for semiconductor apparatus and repair method using the sameSK HYNIX INC·Filed 2015·Granted Mar 15, 2016·0 cites·20 claims
- 2236US9672890B2Semiconductor memory apparatusSK HYNIX INC·Filed 2015·Granted Jun 6, 2017·0 cites·20 claims
- 2334US8511564B2System including semiconductor devices and controller and method for operating the sameYOU JUNG-TAEK·Filed 2010·Granted Aug 20, 2013·0 cites·29 claims
- 2433US2010118614A1Semiconductor apparatus, data write circuit of semiconductor apparatus, and method of controlling data write circuitYOU JUNG TAEK·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →