Inventor · disambiguated record
Jyun-Hong Chen
Also filed as: CHEN JYUN-HONG
17 granted patents·5 pending applications·148 citations·filing 2007–2025
91Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD15INER AEC EXECUTIVE YUAN2CHANG YU-CHING1CHENG DONG-HSU1HUANG HSIAO-PING1
Top patents by PatentIndex Score
22 records- 0196US12027396B2Systems and methods for systematic physical failure analysis (PFA) fault localizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jul 2, 2024·2 cites·20 claims
- 0296US9230867B2Structure and method for E-beam in-chip overlay markTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Jan 5, 2016·65 cites·20 claims
- 0395US12021050B2Semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 25, 2024·2 cites·20 claims
- 0494US11182532B2Hierarchical density uniformization for semiconductor feature surface planarizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Nov 23, 2021·4 cites·19 claims
- 0594US8736084B2Structure and method for E-beam in-chip overlay markCHENG DONG-HSU·Filed 2011·Granted May 27, 2014·67 cites·20 claims
- 0688US11600505B2Systems and methods for systematic physical failure analysis (PFA) fault localizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Mar 7, 2023·3 cites·20 claims
- 0788US2025323074A1Systems and methods for systematic physical failure analysis (pfa) fault localizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0886US12374572B2Systems and methods for systematic physical failure analysis (PFA) fault localizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Jul 29, 2025·0 cites·20 claims
- 0986US2025316630A1Semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1085US10304178B2Method and system for diagnosing a semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 28, 2019·5 cites·20 claims
- 1184US12400987B2Semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Aug 26, 2025·0 cites·20 claims
- 1273US11669957B2Semiconductor wafer measurement method and systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 6, 2023·0 cites·20 claims
- 1370US11094057B2Semiconductor wafer measurement method and systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 17, 2021·0 cites·20 claims
- 1467US11681851B2Hierarchical density uniformization for semiconductor feature surface planarizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 20, 2023·0 cites·20 claims
- 1560US11469198B2Semiconductor device manufacturing method and associated semiconductor dieTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Oct 11, 2022·0 cites·20 claims
- 1659US10762621B2Semiconductor wafer measurement method and systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Sep 1, 2020·0 cites·20 claims
- 1759US2025252550A1Method and system for retrieving diffraction parameter of photomaskTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1845US7399881B1Transesterification process of methyl acetateUNIV NAT TAIWAN·Filed 2007·Granted Jul 15, 2008·0 cites·17 claims
- 1944US2008231621A1Liquid crystal display apparatus, backlight module and light source driving device thereofCHANG YU-CHING·Filed 2008·Application pending·0 cites
- 2043US9981050B2Bispecific peptide conjugate and radioactive bispecific peptide imaging agentINER AEC EXECUTIVE YUAN·Filed 2016·Granted May 29, 2018·0 cites·5 claims
- 2137US10538486B2Hydroxamic acid type contrast agent containing radioisotope fluoride, preparation method and application thereofINER AEC EXECUTIVE YUAN·Filed 2017·Granted Jan 21, 2020·0 cites·2 claims
- 2233US2012123157A1Formic acid manufacturing system and method of manufacturing formic acidHUANG HSIAO-PING·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →