Inventor · disambiguated record
Kazuki Asao
Also filed as: ASAO KAZUKI
8 granted patents·2 pending applications·53 citations·filing 1996–2021
84Inventor score
Top patents by PatentIndex Score
10 records- 0186US10948507B2Specimen transport apparatus, specimen measurement apparatus, specimen transport method, and holderSYSMEX CORP·Filed 2017·Granted Mar 16, 2021·4 cites·22 claims
- 0269US9562920B2Automated analyzer with cover detectionSYSMEX CORP·Filed 2014·Granted Feb 7, 2017·3 cites·10 claims
- 0369US6456137B1Semiconductor circuit, delay adjustment method therefor and layout method thereforNEC CORP·Filed 2000·Granted Sep 24, 2002·17 cites·21 claims
- 0468US9733265B2Method for adjusting position of aspirator and sample processing apparatusSYSMEX CORP·Filed 2014·Granted Aug 15, 2017·2 cites·16 claims
- 0556US12076724B2Specimen processing apparatus, specimen measurement system and method for processing specimenSYSMEX CORP·Filed 2020·Granted Sep 3, 2024·0 cites·9 claims
- 0655US2021301332A1Method for determining success or failure of nucleic acid amplification, device for determining success or failure of nucleic acid amplification, and nucleic acid amplification analysis systemSYSMEX CORP·Filed 2021·Application pending·0 cites
- 0754USD743047SContainer for storing dispensing tipSYSMEX CORP·Filed 2013·Granted Nov 10, 2015·9 cites·1 claims
- 0843US2008066035A1Method and design system of semiconductor integrated circuitNEC ELECTRONICS CORP·Filed 2007·Application pending·0 cites
- 0940US5847967AMethod of calculating a parasitic load in a semiconductor integrated circuitNEC CORP·Filed 1996·Granted Dec 8, 1998·15 cites·8 claims
- 1038USD744553SSample crushing apparatusSYSMEX CORP·Filed 2014·Granted Dec 1, 2015·3 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →