Inventor · disambiguated record
Karen D. Badger
Also filed as: BADGER KAREN D
8 granted patents·1 pending application·12 citations·filing 2000–2010
79Inventor score
Top patents by PatentIndex Score
9 records- 0165US7742632B2Alternating phase shift mask inspection using biased inspection dataIBM·Filed 2006·Granted Jun 22, 2010·2 cites·17 claims
- 0257US6635390B1Method and system for reducing particulate contamination in a pellicle air spaceIBM·Filed 2000·Granted Oct 21, 2003·6 cites·14 claims
- 0353US7974802B2Photomask image inspectionIBM·Filed 2008·Granted Jul 5, 2011·1 cites·15 claims
- 0452US8437967B2Method and system for inspecting multi-layer reticlesBADGER KAREN D·Filed 2010·Granted May 7, 2013·1 cites·25 claims
- 0548US7619730B2Mask inspection DNIR replacement based on location of tri-tone level database images—2P shapesIBM·Filed 2008·Granted Nov 17, 2009·0 cites·6 claims
- 0648US7450748B2Mask inspection process accounting for mask writer proximity correctionIBM·Filed 2003·Granted Nov 11, 2008·2 cites·2 claims
- 0748US2008279443A1Mask inspection process accounting for mask writer proximity correctionBADGER KAREN D·Filed 2008·Application pending·0 cites
- 0847US8538129B2Mask program defect testBADGER KAREN D·Filed 2009·Granted Sep 17, 2013·0 cites·12 claims
- 0941US7443497B2Mask inspection DNIR placement based on location of tri-tone level database images (2P shapes)IBM·Filed 2005·Granted Oct 28, 2008·0 cites·27 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →