Inventor · disambiguated record
Kazutaka Eriguchi
Also filed as: ERIGUCHI KAZUTAKA
5 granted patents·7 citations·filing 2014–2017
68Inventor score
Files withSUMCO CORP5
Top patents by PatentIndex Score
5 records- 0178US10641708B2Method of evaluating semiconductor substrate and method of manufacturing semiconductor substrateSUMCO CORP·Filed 2015·Granted May 5, 2020·3 cites·10 claims
- 0275US11047800B2Method of evaluating carbon concentration of silicon sample, method of evaluating silicon wafer manufacturing process, method of manufacturing silicon wafer, method of manufacturing silicon single crystal ingot, silicon single crystal ingot and silicon waferSUMCO CORP·Filed 2017·Granted Jun 29, 2021·3 cites·13 claims
- 0360US9842779B2Method of evaluating metal contamination in semiconductor wafer and method of manufacturing semiconductor waferSUMCO CORP·Filed 2014·Granted Dec 12, 2017·1 cites·8 claims
- 0448US10935510B2Method of measuring carbon concentration of silicon sample, method of manufacturing silicon single crystal ingot, silicon single crystal ingot and silicon waferSUMCO CORP·Filed 2017·Granted Mar 2, 2021·0 cites·15 claims
- 0543US10676840B2Method of evaluating manufacturing process of silicon material and manufacturing method of silicon materialSUMCO CORP·Filed 2017·Granted Jun 9, 2020·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →