Inventor · disambiguated record
Katsumi Fujihara
Also filed as: FUJIHARA KATSUMI
4 granted patents·2 pending applications·63 citations·filing 1979–2012
73Inventor score
Top patents by PatentIndex Score
6 records- 0178US4392120APattern inspection systemAOKI A & ASS·Filed 1979·Granted Jul 5, 1983·26 cites·13 claims
- 0266US4547895APattern inspection systemFUJITSU LTD·Filed 1982·Granted Oct 15, 1985·36 cites·17 claims
- 0358US8854613B2Surface defect inspection apparatus and surface defect inspection methodFUJIHARA KATSUMI·Filed 2012·Granted Oct 7, 2014·1 cites·10 claims
- 0433US2005162517A1Method and apparatus for testing image pickup deviceFUJITSU LTD·Filed 2004·Application pending·0 cites
- 0532US7633602B2Measurement apparatus and measurement methodFUJITSU LTD·Filed 2007·Granted Dec 15, 2009·0 cites·19 claims
- 0629US2008074650A1Measurement apparatus and measurement methodFUJITSU LTD·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →