Inventor · disambiguated record
Kaoru Fukaya
Also filed as: FUKAYA KAORU
2 granted patents·0 citations·filing 2016–2020
22Inventor score
Files withHITACHI HIGH TECH CORP2
Top patents by PatentIndex Score
2 records- 0149US12474166B2Pattern inspection/measurement device, and pattern inspection/measurement programHITACHI HIGH TECH CORP·Filed 2020·Granted Nov 18, 2025·0 cites·15 claims
- 0225US9947088B2Evaluation condition setting method of semiconductor device, and evaluation condition setting apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 17, 2018·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →