Inventor · disambiguated record
Katsuya Furue
Also filed as: FURUE KATSUYA
3 granted patents·60 citations·filing 2001–2004
73Inventor score
Top patents by PatentIndex Score
3 records- 0182US6962827B1Semiconductor device capable of shortening test time and suppressing increase in chip area, and method of manufacturing semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2003·Granted Nov 8, 2005·29 cites·10 claims
- 0270US6646461B2Method and apparatus for testing semiconductor devices using improved testing sequenceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Nov 11, 2003·17 cites·7 claims
- 0364US6900691B2Semiconductor integrated circuitRENESAS TECH CORP·Filed 2004·Granted May 31, 2005·14 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →