Inventor · disambiguated record

Katsuhiro Gunji

Also filed as: GUNJI KATSUHIRO

2 granted patents·8 citations·filing 2010–2010

53Inventor score

Technology areasG01R

Files withGUNJI KATSUHIRO2

Top patents by PatentIndex Score

2 records

0176US8432176B2Apparatus and method for testing semiconductor devicesGUNJI KATSUHIRO·Filed 2010·Granted Apr 30, 2013·5 cites·15 claims
0263US8446160B2Probe card maintenance method which adjusts position/posture of probesGUNJI KATSUHIRO·Filed 2010·Granted May 21, 2013·3 cites·16 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →