Inventor · disambiguated record
Kay Hessee
Also filed as: HESSEE KAY
2 granted patents·5 citations·filing 2010–2010
51Inventor score
Technology areasG11C
Files withCHEN WEI-YU2
Top patents by PatentIndex Score
2 records- 0163US8423846B2Integrated circuit with memory built-in self test (MBIST) circuitry having enhanced features and methodsCHEN WEI-YU·Filed 2010·Granted Apr 16, 2013·3 cites·24 claims
- 0255US8468408B2Memory built-in self test (MBIST) circuitry configured to facilitate production of pre-stressed integrated circuits and methodsCHEN WEI-YU·Filed 2010·Granted Jun 18, 2013·2 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →