Inventor · disambiguated record
Kazuyuki Hino
Also filed as: HINO KAZUYUKI
7 granted patents·4 pending applications·12 citations·filing 2012–2024
75Inventor score
Top patents by PatentIndex Score
11 records- 0186US9647229B2Color filter for organic electroluminescence display device, and organic electroluminescence display deviceDAINIPPON PRINTING CO LTD·Filed 2012·Granted May 9, 2017·8 cites·15 claims
- 0279US9213199B2Liquid crystal display device and method for manufacturing sameDAINIPPON PRINTING CO LTD·Filed 2015·Granted Dec 15, 2015·2 cites·10 claims
- 0370US10082618B2Image display module with superior white point stabilityDAINIPPON PRINTING CO LTD·Filed 2015·Granted Sep 25, 2018·2 cites·19 claims
- 0466US2024332554A1Carbon material for catalyst support and method for manufacturing carbon material for catalyst supportNISHI NOBUYUKI·Filed 2024·Application pending·0 cites
- 0563US2024327583A1Method for manufacturing gas diffusion layer for fuel cell and gas diffusion layer for fuel cellNISHI NOBUYUKI·Filed 2024·Application pending·0 cites
- 0661US2024327221A1Method for manufacturing porous carbon sheet and porous carbon sheetNISHI NOBUYUKI·Filed 2024·Application pending·0 cites
- 0760US10088611B2Color filter forming substrate, method of manufacturing same and display deviceDAINIPPON PRINTING CO LTD·Filed 2017·Granted Oct 2, 2018·0 cites·1 claims
- 0851US2025061244A1Simulation method, program, and storage mediumKIOXIA CORP·Filed 2024·Application pending·0 cites
- 0950US11901223B2Stress analysis method and semiconductor device manufacturing methodKIOXIA CORP·Filed 2020·Granted Feb 13, 2024·0 cites·11 claims
- 1050US9588265B2Color filter forming substrate, method of manufacturing same and display deviceHINO KAZUYUKI·Filed 2012·Granted Mar 7, 2017·0 cites·4 claims
- 1148US10852648B2Mask pattern correction system, and semiconductor device manufacturing method utilizing said correction systemTOSHIBA MEMORY CORP·Filed 2019·Granted Dec 1, 2020·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →