Inventor · disambiguated record
Katsunori Hirano
Also filed as: HIRANO KATSUNORI
10 granted patents·2 pending applications·74 citations·filing 2001–2019
86Inventor score
Top patents by PatentIndex Score
12 records- 0183US7546506B2DRAM stacked package, DIMM, and semiconductor manufacturing methodHITACHI LTD·Filed 2006·Granted Jun 9, 2009·15 cites·7 claims
- 0283US7137055B2Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memoryELPIDA MEMORY INC·Filed 2004·Granted Nov 14, 2006·38 cites·15 claims
- 0377US10522325B2Charged particle beam device and image processing method in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Dec 31, 2019·2 cites·17 claims
- 0469US7114110B2Semiconductor device, and the method of testing or making of the semiconductor deviceRENESAS TECH CORP·Filed 2003·Granted Sep 26, 2006·12 cites·5 claims
- 0563US10763078B2Charged particle beam device and image processing method in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 1, 2020·0 cites·17 claims
- 0660US7952072B2Test apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted May 31, 2011·0 cites·15 claims
- 0759US6979810B2Optical modules and methods of making the optical modulesOPNEXT JAPAN INC·Filed 2001·Granted Dec 27, 2005·6 cites·14 claims
- 0858US9489324B2Data processing device, semiconductor external view inspection device, and data volume increase alleviation methodHITACHI HIGH TECH CORP·Filed 2012·Granted Nov 8, 2016·1 cites·12 claims
- 0949US8304726B2Test apparatusHIRANO KATSUNORI·Filed 2011·Granted Nov 6, 2012·0 cites·3 claims
- 1047US7870428B2Method of diagnosing circuit board, circuit board, and CPU unitHITACHI LTD·Filed 2007·Granted Jan 11, 2011·0 cites·19 claims
- 1141US2011279143A1Semiconductor wafer testing apparatusTOBA TADANOBU·Filed 2009·Application pending·0 cites
- 1240US2008244329A1Apparatus diagnosing method, apparatus diagnosis module, and apparatus mounted with apparatus diagnosis moduleSHINBO KENICHI·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →