Inventor · disambiguated record
Kazutoshi Ishii
Also filed as: ISHII KAZUTOSHI
25 granted patents·1 pending application·654 citations·filing 1988–2004
96Inventor score
Top patents by PatentIndex Score
26 records- 0195US6022792ASemiconductor dicing and assembling methodSEIKO INSTR INC·Filed 1997·Granted Feb 8, 2000·215 cites·13 claims
- 0287US5449637AMethod of producing low and high voltage MOSFETs with reduced masking stepsSEIKO INSTR INC·Filed 1993·Granted Sep 12, 1995·69 cites·7 claims
- 0387US5065222ASemiconductor device having two-layered passivation filmSEIKO INSTR INC·Filed 1988·Granted Nov 12, 1991·77 cites·11 claims
- 0486US6747319B2Semiconductor device and method of fabricating the sameSEIKO INSTR INC·Filed 2001·Granted Jun 8, 2004·35 cites·4 claims
- 0584US5663589ACurrent regulating semiconductor integrated circuit device and fabrication method of the sameSEIKO INSTR INC·Filed 1994·Granted Sep 2, 1997·56 cites·43 claims
- 0683USD368521SUltrasonic diagnostic unitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1994·Granted Apr 2, 1996·24 cites·1 claims
- 0777US6222235B1Small geometry high voltage semiconductor deviceSEIKO INSTR INC·Filed 1996·Granted Apr 24, 2001·37 cites·13 claims
- 0873US6777752B2Complementary MOS semiconductor deviceSEIKO INSTR INC·Filed 2001·Granted Aug 17, 2004·18 cites·37 claims
- 0971US6492692B1Semiconductor integrated circuit and manufacturing method thereforeSEIKO INSTR INC·Filed 1999·Granted Dec 10, 2002·36 cites·8 claims
- 1064US6545322B2Semiconductor protection deviceSEIKO INSTR INC·Filed 2001·Granted Apr 8, 2003·11 cites·18 claims
- 1162US7161198B2Semiconductor integrated circuit device having MOS transistorSEIKO INSTR INC·Filed 2002·Granted Jan 9, 2007·11 cites·30 claims
- 1262US6596593B2Method of manufacturing semiconductor device employing oxygen implantationSEIKO INSTR INC·Filed 2001·Granted Jul 22, 2003·9 cites·8 claims
- 1361US6713820B2Semiconductor deviceSEIKO INSTR INC·Filed 2002·Granted Mar 30, 2004·10 cites·15 claims
- 1460US7192790B2Manufacturing method for a semiconductor deviceSEIKO INSTR INC·Filed 2004·Granted Mar 20, 2007·7 cites·20 claims
- 1551US7335518B2Method for manufacturing semiconductor deviceSEIKO INSTR INC·Filed 2004·Granted Feb 26, 2008·3 cites·20 claims
- 1651US7129099B2Method for manufacturing semiconductor deviceSEIKO INSTR INC·Filed 2004·Granted Oct 31, 2006·3 cites·3 claims
- 1750US6492680B1Semiconductor integrated circuit deviceSEIKO INSTR INC·Filed 2000·Granted Dec 10, 2002·6 cites·3 claims
- 1849US7351595B2Method for manufacturing semiconductor deviceSEIKO INSTR INC·Filed 2004·Granted Apr 1, 2008·2 cites·7 claims
- 1945US6906345B2Semiconductor device and method of manufacturing the sameSEIKO INSTR INC·Filed 2003·Granted Jun 14, 2005·1 cites·11 claims
- 2043US6359639B1Thermal head driving integrated circuitSEIKO INSTR INC·Filed 1999·Granted Mar 19, 2002·9 cites·20 claims
- 2141US6107128ASemiconductor device and method of manufacturing the sameSEIKO INSTR INC·Filed 1999·Granted Aug 22, 2000·9 cites·6 claims
- 2240US7043328B2Method for manufacturing semiconductor device utilizing monitor wafersSEIKO INSTR INC·Filed 2004·Granted May 9, 2006·0 cites·6 claims
- 2333US2001038129A1CMOS transistor semiconductor deviceFiled 2001·Application pending·0 cites
- 2431US5324677AMethod of making memory cell and a peripheral circuitSEIKO INSTR INC·Filed 1990·Granted Jun 28, 1994·2 cites·13 claims
- 2529US6134136ASemiconductor integrated circuit deviceSEIKO INSTR INC·Filed 1999·Granted Oct 17, 2000·4 cites·8 claims
- 2627US6346960B1Thermal head driving integrated circuitSEIKO INSTR INC·Filed 1999·Granted Feb 12, 2002·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →