Inventor · disambiguated record
Kazuaki Kawaguchi
Also filed as: KAWAGUCHI KAZUAKI
16 granted patents·2 pending applications·199 citations·filing 2001–2021
93Inventor score
Top patents by PatentIndex Score
18 records- 0194US6826104B2Synchronous semiconductor memoryTOSHIBA KK·Filed 2002·Granted Nov 30, 2004·81 cites·18 claims
- 0287US6879540B2Synchronous semiconductor memory device having dynamic memory cells and operating method thereofTOSHIBA KK·Filed 2003·Granted Apr 12, 2005·46 cites·13 claims
- 0376US7796461B2Semiconductor device having a plurality of memory chipsTOSHIBA KK·Filed 2007·Granted Sep 14, 2010·7 cites·15 claims
- 0467US6731559B2Synchronous semiconductor memory deviceTOSHIBA KK·Filed 2002·Granted May 4, 2004·15 cites·21 claims
- 0565US6757214B2Synchronous type semiconductor memory deviceTOSHIBA KK·Filed 2003·Granted Jun 29, 2004·13 cites·19 claims
- 0661US8264867B2Nonvolatile semiconductor storage deviceKAWAGUCHI KAZUAKI·Filed 2010·Granted Sep 11, 2012·3 cites·20 claims
- 0760US6885606B2Synchronous semiconductor memory device with a plurality of memory banks and method of controlling the sameTOSHIBA KK·Filed 2003·Granted Apr 26, 2005·11 cites·16 claims
- 0854US6973000B2Synchronous semiconductor memory device of fast random cycle system and test method thereofTOSHIBA KK·Filed 2003·Granted Dec 6, 2005·7 cites·7 claims
- 0953US7697353B2Semiconductor deviceKABUHSIKI KAISHA TOSHIBA·Filed 2007·Granted Apr 13, 2010·3 cites·12 claims
- 1052US7102959B2Synchronous semiconductor memory device of fast random cycle system and test method thereofTOSHIBA KK·Filed 2005·Granted Sep 5, 2006·2 cites·7 claims
- 1152US7064988B2Synchronous semiconductor memory device of fast random cycle system and test method thereofTOSHIBA KK·Filed 2005·Granted Jun 20, 2006·2 cites·7 claims
- 1249US8593852B2Test device and test method for resistive random access memory and resistive random access memory deviceKAWAGUCHI KAZUAKI·Filed 2011·Granted Nov 26, 2013·1 cites·9 claims
- 1347US7120078B2Synchronous semiconductor memoryTOSHIBA KK·Filed 2004·Granted Oct 10, 2006·4 cites·13 claims
- 1442US11862254B2Semiconductor integrated circuitKIOXIA CORP·Filed 2021·Granted Jan 2, 2024·0 cites·17 claims
- 1542US6999356B2Semiconductor device capable of readjusting a reference potential during the reliabilty testTOSHIBA KK·Filed 2004·Granted Feb 14, 2006·4 cites·18 claims
- 1639US8074144B2Semiconductor storage deviceKANAGAWA NAOAKI·Filed 2007·Granted Dec 6, 2011·0 cites·12 claims
- 1733US2011019492A1Test device and test method for resistive random access memory and resistive random access memory deviceTOSHIBA KK·Filed 2010·Application pending·0 cites
- 1831US2001030900A1Synchronous semiconductor memoryTOSHIBA KK·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →